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Bulletin of the American Physical Society

Resolving fast dynamics through measurement in the frequency domain

Riccardo Borgani, David B. Haviland

Published Mar 4, 2020• 0 citations
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Parasitic two-level-system (TLS) defects are a major source of energy relaxation and temporal instability in superconducting quantum processors. Our sub-second adaptive spectroscopy reveals telegraphic switching of TLSs with a characteristic timescale of a few seconds and spectral diffusion with diffusivity D≈0.9 MHz2/sD \approx 0.9~\mathrm{MHz}^2/\mathrm{s}D≈0.9 MHz2/s. These timescales are about 3×1023 \times 10^23×102 times faster than what is observed in conventional nonadaptive spectroscopy, which typically requires hours of measurement time. We resolve such fast dynamics on a field-programmable gate array (FPGA)-based controller that enables measurement of frequency- and time-resolved relaxations with sub-second temporal resolution in flux-tunable superconducting qubits. We observe similar defect dynamics across multiple qubits in independently fabricated devices measured in different laboratories. We correlate TLS-induced fluctuations with gate-level errors using randomized benchmarking. Our results reveal a previously inaccessible regime of frequency-resolved TLS dynamics and redefine the timescales relevant to TLS-aware characterization and calibration of superconducting quantum processors.
In this paper, we propose and demonstrate a new method for measuring the trap frequency from the fluorescence dynamics of an ion, initiated using fast trap-center displacement. Here, we observe the coherently excited motion of an ion in a harmonic trap using time-resolved fluorescence detection. Furthermore, Fourier analysis of the ion fluorescence signal was used to determine the trap frequency of an ion with high precision and reproducibility. The results show that our proposed method can be an alternative way to determine trap frequencies in an ion trap experiment.