Metrological Multiparameter Squeezing
Manuel Gessner, Augusto Smerzi, Luca Pezzè
Abstract
Squeezing currently represents the leading strategy to obtain quantum enhancements for precision measurements of single parameters in a variety of continuous- and discrete-variable settings. However, many important physical problems including imaging and field sensing require the simultaneous measurement of multiple unknown parameters. Here, we derive a general, operational concept of multiparameter squeezing from the sensitivity matrix of quantum metrology. Our formalism identifies metrologically useful multiparameter squeezing of arbitrary observables and systems. We provide an analytical solution to the optimization over the measurement observables and the phase-imprinting Hamiltonians to maximize sensitivity. When applied to spin- or continuous-variable systems, our results generalize widely-used concepts of spin- or quadrature squeezing parameters. The squeezing matrix provides a practical and versatile tool for the development of quantum-enhanced multiparameter measurements and the efficient characterization of multimode quantum states.