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Conference on Lasers and Electro-Optics

Entanglement-Enhanced Measurement of a Completely Unknown Phase

Dominic William Berry, Guo‐Yong Xiang, Brendon L. Higgins, Howard M. Wiseman, Geoff J. Pryde

Published Jan 1, 2010• 0 citations
Publisher

Abstract

We demonstrate a method for achieving phase measurements with accuracy beyond the standard quantum limit using entangled states. A sophisticated feedback scheme means that no initial estimate of the phase is required.
DOI
10.1364/qels.2010.qthj5

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Quantum metrology exploits entangled states of particles to improve sensing precision beyond the limit achievable with uncorrelated particles. All previous methods required detection noise levels below this standard quantum limit to realize the benefits of the intrinsic sensitivity provided by these states. We experimentally demonstrate a widely applicable method for entanglement-enhanced measurements without low-noise detection. The method involves an intermediate quantum phase magnification step that eases implementation complexity. We used it to perform squeezed-state metrology 8 decibels below the standard quantum limit with a detection system that has a noise floor 10 decibels above the standard quantum limit.
The use of quantum resources can provide measurement precision beyond the shot noise limit (SNL). The task of ab initio optical phase measurement-the estimation of a completely unknown phase-has been experimentally demonstrated with precision beyond the SNL, and even scaling like the ultimate bound, the Heisenberg limit (HL), but with an overhead factor. However, existing approaches have not been able-even in principle-to achieve the best possible precision, saturating the HL exactly. Here we demonstrate a scheme to achieve true HL phase measurement, using a combination of three techniques: entanglement, multiple samplings of the phase shift, and adaptive measurement. Our experimental demonstration of the scheme, with photonic qubits and N = 3 photon-passes, achieves a precision that is within 4% of the HL, surpassing the best precision theoretically achievable with simpler techniques. This work represents a fundamental achievement of the ultimate limits of metrology, and the scheme can be extended to higher N and other physical systems.