True Random Number Generator Using Beta Decay

Daniel Rüschen, Johannes Freese, Moritz Cajetan Schrey +1 more

Mario Stipčević, Çetin Kaya Koç

Abdullah Ash Saki, Mahabubul Alam, Swaroop Ghosh

Kyung Hwan Park, Seong Mo Park, Byoung Gun Choi +2 more

This paper relates to a technique for generating true random numbers at high speed from the nuclear decay of beta radioisotopes. The true random number is obtained by detecting beta radiation from Ni-63 radioisotope which emits only pure beta particle. For high rate random number generation, the best specification on Ni-63 beta radiation source is introduced. Then, a high-sensitivity detection circuit that can detect the beta radiation and make short pulse will be briefly described. A series of pulses from the detection circuit are converted to random numbers. Finally, it is confirmed that the random number is a true random number by statistical analysis and the NIST 800-22 test.

Kyung‐Hwan Park, Seongmo Park, Byoung Gun Choi +4 more

This paper presents a lightweight true random number generator (TRNG) using beta radiation that is useful for Internet of Things (IoT) security. In general, a random number generator (RNG) is required for all secure communication devices because random numbers are needed to generate encryption keys. Most RNGs are computer algorithms and use physical noise as their seed. However, it is difficult to obtain physical noise in small IoT devices. Since IoT security functions are required in almost all countries, IoT devices must be equipped with security algorithms that can pass the cryptographic module validation programs of each country. In this regard, it is very cumbersome to embed security algorithms, random number generation algorithms, and even physical noise sources in small IoT devices. Therefore, this paper introduces a lightweight TRNG comprising a thin-film beta-radiation source and integrated circuits (ICs). Although the ICs are currently being designed, the IC design was functionally verified at the board level. Our random numbers are output from a verification board and tested according to National Institute of Standards and Technology standards.

Rok Žitko

Abstract Flicker (pink, 1/\(f\)) noise is ubiquitous in all electronic devices, including in oscillator circuits used in true random number generators (TRNGs) based on jitter. Flicker noise produces strong serial correlations with very slow decay in time. We present a stochastic model for counter-mode TRNGs that takes the effects of such time correlations into account. Key parameters in the model are the spectral strengths of the pink and white noise components, as well as the low-frequency cutoff for the flicker noise spectrum. The random bits are defined as the least significant bit of consecutive integer-valued count numbers. We present the dependence of autocorrelations and min-entropy of generated random bits on model parameters. The autocorrelation between the bits is suppressed by increasing the strength of either pink or white noise, but it remains long-ranged (power-law decay). The power-law exponent depends linearly on the strength of pink noise, while the prefactor depends exponentially on both strengths. We determine the min-entropy per bit from a careful analysis of long-time sequences. It approaches the value of 1 approximately as a stretched exponential function of the flicker noise strength: highly entropic random bit generators can thus be designed even in the presence of strong flicker noise. We also propose an effective and efficient online health test for generators of this type.