Journal of Low Temperature Physics
A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits
Abigail L. Wessels, Daniel Becker, D. A. Bennett, Johnathon D. Gard, Johannes Hubmayr, N. Jarosik, V. Kotsubo, John A. B. Mates, Joel N. Ullom
Published Aug 3, 2018• 1 citation