Conference on Lasers and Electro-Optics

Infrared metrology using visible photons

Anna V. Paterova, Hongzhi Yang, Chengwu An, Dmitry A. Kalashnikov, Leonid A. Krivitsky

Published Jan 1, 2018• 0 citations

Abstract

We exploit the nonlinear interference of correlated photons to demonstrate a new infrared metrology technique using detection of visible photons. The technique applies to infrared spectroscopy, optical coherence tomography, and imaging.

DOI: 10.1364/cleo_at.2018.ath3o.3

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