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Conference on Lasers and Electro-Optics

Atomic Force Microscopy Beyond the Standard Quantum Limit

Benjamin J. Lawrie, Raphael C. Pooser

Published Jan 1, 2018• 0 citations
Publisher

Abstract

We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.
DOI
10.1364/cleo_at.2018.jf2b.3

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Label-free optical microscopy through absorption or scattering spectroscopy provides fundamental insights across biology and materials science, yet its sensitivity remains fundamentally limited by photon shot noise. While recent demonstrations of quantum nonlinear microscopy show sub-shot-limited sensitivity, they are intrinsically limited by availability of high peak-power squeezed light sources. Here, we introduce squeezing-enhanced photothermal (SEPT) microscopy, a quantum imaging technique that leverages twin-beam quantum correlations to detect absorption induced signals with unprecedented sensitivity. SEPT achieves 3.5 dB noise suppression beyond the standard quantum limit, enabling a 2.5-fold increase in imaging throughput or 31% reduction in pump power, while providing an unmatched versatility through the intrinsic compatibility between continuous-wave squeezing and photothermal modulation. We showcase SEPT applications by providing high-precision characterization of nanoparticles and revealing subcellular structures, such as cytochrome c, that remain undetectable under shot-noise-limited imaging. By combining label-free contrast, quantum-enhanced sensitivity, and compatibility with existing microscopy platforms, SEPT establishes a new paradigm for molecular absorption imaging with far-reaching implications in cellular biology, nanoscience, and materials characterization.