Nanometer resolution mask lithography with matter waves
Torstein Nesse, Ingve Simonsen, Bodil Holst
Abstract
Mask based pattern generation with photolithography is a crucial step in microchip production. The next generation Extreme Ultra Violet (EUV) lithography instruments with a wavelength of 13.5 nm is currently under development. In principle this allows patterning down to a few nm resolution in a single exposure. However, there are many technical challenges due to the very high energy of the photons among others. Lithography with metastable atoms has been suggested as a cost effective, less complex alternative to EUV lithography. The big advantage of atom lithography is that the kinetic energy of an atom is much smaller than that of a photon for a given wavelength. However up till now no method has been available for making masks for atom lithography that can produce arbitrary, high resolution patterns. Here we present a solution to this problem. We show that it is possible to make masks based on binary holography that can generate arbitrary patterns down to a few nm resolution using a state of the art metastable helium source. We compare the flux of this source with that of an established EUV source (ASML, NXE:3100) and show that patterns can potentially be produced at comparable speeds. Finally we present an extension of the grid based holography method for a grid of hexagonally shaped subcells. Our method can be used with any wave beam, including other matter wave beams such as helium ions or electrons.