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Bulletin of the American Physical Society

Randomized Benchmarking of Almost Any Gate Set

Timothy J Proctor, Arnaud Carignan-Dugas, Melissa Revelle, Daniel Lobser, Peter Maunz, Robin Blume-Kohout, Kevin C Young

Published Mar 7, 2018• 0 citations
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Randomized benchmarking (RB) protocols are the most widely used methods for assessing the performance of quantum gates.However, the existing RB methods either do not scale to many qubits or cannot benchmark a universal gate set.Here, we introduce and demonstrate a technique for scalable RB of many universal and continuously parametrized gate sets, using a class of circuits called randomized mirror circuits.Our technique can be applied to a gate set containing an entangling Clifford gate and the set of arbitrary single-qubit gates, as well as gate sets containing controlled rotations about the Pauli axes.We use our technique to benchmark universal gate sets on four qubits of the Advanced Quantum Testbed, including a gate set containing a controlled-S gate and its inverse, and we investigate how the observed error rate is impacted by the inclusion of non-Clifford gates.Finally, we demonstrate that our technique scales to many qubits with experiments on a 27-qubit IBM Q processor.We use our technique to quantify the impact of crosstalk on this 27-qubit device, and we find that it contributes approximately 2=3 of the total error per gate in random many-qubit circuit layers.
We show that the Randomized Benchmarking (RB) protocol is a convolution amenable to Fourier space analysis. By adopting the mathematical framework of Fourier transforms of matrix-valued functions on groups established in recent work from Gowers and Hatami \cite{GH15}, we provide an alternative proof of Wallman's \cite{Wallman2018} and Proctor's \cite{Proctor17} bounds on the effect of gate-dependent noise on randomized benchmarking. We show explicitly that as long as our faulty gate-set is close to the targeted representation of the Clifford group, an RB sequence is described by the exponential decay of a process that has exactly two eigenvalues close to one and the rest close to zero. This framework also allows us to construct a gauge in which the average gate-set error is a depolarizing channel parameterized by the RB decay rates, as well as a gauge which maximizes the fidelity with respect to the ideal gate-set.