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Frontiers in Optics

Enhancement of Electromagnetically-induced Focusing by a Microwave Field

Onkar N. Verma, Sourabh Roy

Published Jan 1, 2017• 0 citations
Publisher

Abstract

We have theoretically studied the effect of a microwave field on electromagnetically-induced focusing of a weak probe beam due to spatial variations of control beam in an electromagnetically-induced transparency medium.
DOI
10.1364/fio.2017.jtu3a.30

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The theoretical basis for electromagnetically-induced focusing (EIF), which is caused by spatial variations in the coupling laser strength in an electromagnetically-induced transparency (EIT) experiment, is studied in detail. Using a numerical model it is shown that radial changes in both absorption and refractive index are important in predicting the probe beam's propagation conditions. Detailed calculations of the focusing and defocusing during EIF under various conditions are presented and compared with appropriate experiments. Diffractionlike patterns are predicted for, and observed on, a probe beam after propagation through a smaller EIT aperture. \textcopyright{} 1996 The American Physical Society.
We describe the temporal and spatial dynamics of propagating electromagnetically induced transparency pulses in an optically thick medium. Results include pulse velocities as slow as c/165c/165c/165 with 55% transmission, strong-probe-field effects, and the observation of near diffraction-limited transmitted beam quality.
Abstract We theoretically show the effect of a microwave field on the induced focusing of an optical weak probe beam by a copropagating nonuniform control beam in an electromagnetically induced transparency medium. Our numerical simulation shows that, in the presence of a microwave field, probe beam focusing is phase-sensitive and the focused beam size is reduced by 70% of its initial width. In contrast, in the absence of a microwave field, the reduction in the size of the transmitted probe beam is only about 30%. This approach is also successfully applied to the focusing of the diffraction-limited structure of the probe beam.