Optimization and Error-Corrected Quantum Sensing with NV Centers in SiC: An Extension to EPR/ENDOR Characterization
Pacha Lohith Chowdary, Balagala Chethan, Swaminadhan Rajula
This extension method advances the characterization of NV centers in silicon carbide (SiC) by incorporating optimization strategies, machine learning (ML), error correction, and advanced sensing protocols. While the base method validated NV centers in 4H-SiC and 6H-SiC as promising solid-state qubits, our extension aims to enhance their performance and scalability for quantum technologies. First, we identified an optimal NV ensemble density of 1.0 × 10¹⁶ cm⁻3, balancing signal strength with minimized dipole–dipole interactions, thereby maximizing collective coherence. Second, a machine learning framework was developed to optimize experimental conditions, scanning laser power, excitation wavelength, and temperature to improve phase coherence time (T₂) by nearly two-fold. Third, advanced quantum sensing protocols were benchmarked, including Ramsey, Spin-Echo, CPMG, XY-8, and ML-optimized pulse sequences, achieving up to 3.5× higher sensitivity compared to conventional spin-echo. Fourth, dynamical decoupling (N=16) was applied to mitigate decoherence, extending T₂ up to ~60 μs at room temperature. Finally, error correction simulations at the NV ensemble level demonstrated logical error rate reductions by nearly two orders of magnitude, showcasing fault-tolerance potential. Overall, this extension transforms NV–SiC centers from characterized quantum defects into a practical platform with enhanced coherence, improved sensing capabilities, and integrated error correction. These results position SiC NV ensembles as a scalable candidate for next-generation quantum computing
International Conference on Electronics, Communication and Aerospace Technology (ICECA)•Nov 5, 2025•0 citations