Nano Letters
Thermally Induced Parametric Instability in a Back-Action Evading Measurement of a Micromechanical Quadrature near the Zero-Point Level
Junho Suh, Matthew D. Shaw, Henry George LeDuc, Alan J Weinstein, Keith Schwab
Abstract
We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.