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Chinese Physics Letters

Measurement of Heating Rates in a Microscopic Surface-Electrode Ion Trap

Jiu-Zhou He, L.-L. Yan, Liang Chen, Ji Li, Mang Feng

Published Jun 1, 2017• 2 citations
Publisher

Abstract

We report measurement of heating rates of 40 C a + ions confined in our home-made microscopic surface-electrode trap by a Doppler recooling method. The ions are trapped with approximately 800 μ m above the surface, and are subjected to heating due to various noises in the trap. There are 3–5 ions involved to measure the heating rates precisely and efficiently. We show the heating rates in variance with the number and the position of the ions as well as the radio-frequency power, which are helpful for understanding the trap imperfection.

DOI
10.1088/0256-307x/34/6/063701

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We report measurement of heating rates of 40 C a + ions confined in our home-made microscopic surface-electrode trap by a Doppler recooling method. The ions are trapped with approximately 800 μ m above the surface, and are subjected to heating due to various noises in the trap. There are 3–5 ions involved to measure the heating rates precisely and efficiently. We show the heating rates in variance with the number and the position of the ions as well as the radio-frequency power, which are helpful for understanding the trap imperfection.
We report heating rate measurements in a microfabricated gold-on-sapphire surface electrode ion trap with a trapping height of approximately 240 μm. Using the Doppler recooling method, we characterize the trap heating rates over an extended region of the trap. The noise spectral density of the trap falls in the range of noise spectra reported in ion traps at room temperature. We find that during the first months of operation, the heating rates increase by approximately one order of magnitude. The increase in heating rates is largest in the ion-loading region of the trap, providing a strong hint that surface contamination plays a major role for excessive heating rates. We discuss data found in the literature and the possible relation of anomalous heating to sources of noise and dissipation in other systems, namely impurity atoms adsorbed onto metal surfaces and amorphous dielectrics.
We have measured motional heating rates of trapped atomic ions, a factor that can influence multi-ion quantum logic gate fidelities. Two simplified techniques were developed for this purpose: one relies on Raman sideband detection implemented with a single laser source, while the second is even simpler and is based on time-resolved fluorescence detection during Doppler recooling. We applied these methods to determine heating rates in a microfrabricated surface-electrode trap made of gold on fused quartz, which traps ions $40\phantom{\rule{0.3em}{0ex}}\mathrm{\ensuremath{\mu}}\mathrm{m}$ above its surface. Heating rates obtained from the two techniques were found to be in reasonable agreement. In addition, the trap gives rise to a heating rate of $300\ifmmode\pm\else\textpm\fi{}30\phantom{\rule{0.3em}{0ex}}{\mathrm{s}}^{\ensuremath{-}1}$ for a motional frequency of 5.25MHz5.25\phantom{\rule{0.3em}{0ex}}\mathrm{MHz}5.25MHz, substantially below the trend observed in other traps.
Motional heating of ions in microfabricated traps is one of the open challenges hindering experimental realizations of large-scale quantum processing devices. Recently, a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise remains incomplete. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first-principles calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency, and temperature dependence of the resulting electric field fluctuation spectrum. Our theory reproduces correctly the ${d}^{\ensuremath{-}4}$ dependence with distance of the ion from the electrode surface and calculates the noise spectrum beyond the standard scenario of two-level fluctuators by incorporating all the relevant vibrational states. Our model predicts a regime of 1/f1/f1/f noise which commences at roughly the frequency of the fundamental phonon transition rate and a thermally activated noise spectrum which for higher temperatures exhibits a crossover as a function of frequency.
We have investigated motional heating of laser-cooled 9Be+{}^{9}{\mathrm{Be}}^{+}9Be+ ions held in radio-frequency (Paul) traps. We have measured heating rates in a variety of traps with different geometries, electrode materials, and characteristic sizes. The results show that heating is due to electric-field noise from the trap electrodes that exerts a stochastic fluctuating force on the ion. The scaling of the heating rate with trap size is much stronger than that expected from a spatially uniform noise source on the electrodes (such as Johnson noise from external circuits), indicating that a microscopic uncorrelated noise source on the electrodes (such as fluctuating patch-potential fields) is a more likely candidate for the source of heating.
We present measurements of trapped-ion motional-state heating rates in niobium and gold surface-electrode ion traps over a range of trap-electrode temperatures from approximately 4 K to room temperature (295 K) in a single apparatus.Using the sideband-ratio technique after resolved-sideband cooling of single ions to the motional ground state, we find low-temperature heating rates more than two orders of magnitude below the room-temperature values and approximately equal to the lowest measured heating rates in similarly sized cryogenic traps. We find similar behavior in the two very different electrode materials, suggesting that the anomalous heating process is dominated by non-material-specific surface contaminants. Through precise control of the temperature of cryopumping surfaces, we also identify conditions under which elastic collisions with the background gas can lead to an apparent steady heating rate, despite rare collisions.
We measure ion heating following transport throughout a Y\mathsf{Y}Y-junction surface-electrode ion trap. By carefully selecting the trap voltage update rate during adiabatic transport along a trap arm, we observe minimal heating relative to the anomalous heating background. Transport through the junction results in an induced heating between 37 and 150 quanta in the axial direction per traverse. To reliably measure heating in this range, we compare the experimental sideband envelope, including up to fourth-order sidebands, to a theoretical model. The sideband envelope method allows us to cover the intermediate heating range inaccessible to the first-order sideband and Doppler recooling methods. We conclude that quantum information processing in this ion trap will likely require sympathetic cooling in order to support high fidelity gates after junction transport.