Bulletin of the American Physical Society
Atom Trap Trace Analysis Reaches a Part-per-quadrillion Sensitivity
Wei Jiang, William G. Williams, K. Bailey, A. M. Davis, Shui-Ming Hu, Zheng‐Tian Lu, Thomas P. O’Connor, Roland Purtschert, Neil C. Sturchio, Yun Sun, Peter Mueller
Published Jun 15, 2011• 0 citations