Shot Noise in Anyonic Mach-Zehnder Interferometer

Dima E. Feldman

Alain Miffre, Marion Jacquey, M Büchner +2 more

Alain Joyet, Giovanni Di Domenico, P. Thomann

Jungsang Kim, Seema Somani, Y. Yamamoto

Florian Marquardt, Christoph Bruder

We analyze shot noise under the influence of dephasing in an electronic Mach-Zehnder interferometer, of the type that was realized recently [Nature (London) 422, 415 (2003)]]. Using a model of dephasing by a fluctuating classical field, we show how the usual partition noise expression T(1-T) is modified. We study the dependence on the power spectrum of the field, which is impossible in simpler approaches such as the dephasing terminal, against which we compare. We remark on shot noise as a tool to distinguish thermal smearing from genuine dephasing.

Navketan Batra, Zezhu Wei, Smitha Vishveshwara +1 more

Anyonic interferometry is a direct probe of fractional statistics. We propose an interferometry geometry that parallels an optical Mach-Zehnder interferometer and offers several advantages over existing interferometry schemes. In contrast to the currently studied electronic Mach-Zehnder interferometer, our setup has no drain inside the device so that the trapped topological charge is time-independent. In contrast to electronic Fabry-Pérot interferometry, anyons cannot go around the device more than once. Thus, the interference signal has a straightforward interpretation in terms of anyonic statistical phases. The proposed geometry suppresses the undesirable effects of bulk-edge coupling. Moreover, the setup allows for simple exact solutions for the electric current and noise for an arbitrary quasiparticle tunneling strength in a broad range of conditions. The structure of the solutions is similar to that for non-interacting electrons but reflects fractional charge and statistics. We present results for electric current and noise in Jain states and address thermal interferometry at zero voltage bias.