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Probabilistic quantum metrology? Probably not

Joshua Combes, Christopher Ferrie, Jiang Zhang, Carlton M. Caves

Published Sep 25, 2013• 1 citation
OpenAlex

Abstract

Probabilistic metrology attempts to improve parameter estimation by occasionally reporting an excellent estimate and the rest of the time either guessing or doing nothing at all. Here we show that probabilistic metrology can never improve quantum limits on estimation of a single parameter, both on average and asymptotically in number of trials, if performance is judged relative to mean-square estimation error. We extend the result by showing that for a finite number of trials, the probability of obtaining better estimates using probabilistic metrology, as measured by mean-square error, decreases exponentially with the number of trials. To be tight, the performance bounds we derive require that likelihood functions be approximately normal, which in turn depends on how rapidly specific distributions converge to a normal distribution with number of trials.

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Probabilistic metrology attempts to improve parameter estimation by occasionally reporting an excellent estimate and the rest of the time either guessing or doing nothing at all. Here we show that probabilistic metrology can never improve quantum limits on estimation of a single parameter, both on average and asymptotically in number of trials, if performance is judged relative to mean-square estimation error. We extend the result by showing that for a finite number of trials, the probability of obtaining better estimates using probabilistic metrology, as measured by mean-square error, decreases exponentially with the number of trials. To be tight, the performance bounds we derive require that likelihood functions be approximately normal, which in turn depends on how rapidly specific distributions converge to a normal distribution with number of trials.
Probabilistic metrology attempts to improve parameter estimation by occasionally reporting an excellent estimate and the rest of the time either guessing or doing nothing at all. Here we show that probabilistic metrology can never improve quantum limits on estimation of a single parameter, both on average and asymptotically in number of trials, if performance is judged relative to mean-square estimation error. We extend the result by showing that for a finite number of trials, the probability of obtaining better estimates using probabilistic metrology, as measured by mean-square error, decreases exponentially with the number of trials. To be tight, the performance bounds we derive require that likelihood functions be approximately normal, which in turn depends on how rapidly specific distributions converge to a normal distribution with number of trials.
Precise measurement is crucial to science and technology. However, the rule of nature imposes various restrictions on the precision that can be achieved depending on specific methods of measurement. In particular, quantum mechanics poses the ultimate limit on precision which can only be approached but never be violated. Depending on analytic techniques, these bounds may not be unique. Here, in view of prior information, we investigate systematically the precision bounds of the total mean-square error of vector parameter estimation which contains ddd independent parameters. From quantum Ziv-Zakai error bounds, we derive two kinds of quantum metrological bounds for vector parameter estimation, both of which should be satisfied. By these bounds, we show that a constant advantage can be expected via a simultaneous estimation strategy over the optimal individual estimation strategy, which solves a long-standing problem. A general framework for obtaining the lower bounds in a noisy system is also proposed.
The number of times that we can access a system to extract information via quantum metrology is always finite, and possibly small, and realistic amounts of prior knowledge tend to be moderate. Thus theoretical consistency demands a methodology that departs from asymptotic approximations and restricted parameter locations, while practical convenience requires that it is also flexible and easy to use in applications with limited data. We submit that this methodology can and should be built on a Bayesian framework, and in this thesis we propose, construct, explore and exploit a new non-asymptotic quantum metrology. First we show the consistency of taking those solutions that are optimal in the asymptotic regime of many trials as a guide to calculate a Bayesian measure of uncertainty. This provides an approximate but useful way of studying the non-asymptotic regime whenever an exact optimisation is intractable, and it avoids the non-physical results that can arise when only the asymptotic theory is used. Secondly, we construct a new non-asymptotic Bayesian bound without relying on the previous approximation by first selecting a single-shot optimal quantum strategy, and then simulating a sequence of repetitions of this scheme. These methods are then applied to a single-parameter Mach-Zehnder interferometer, and to multi-parameter qubit and optical sensing networks. Our results provide a detailed characterisation of how the interplay between prior information, correlations and a limited amount of data affects the performance of quantum metrology protocols, which opens the door to a vast set of unexplored possibilities to enhance non-asymptotic schemes. Finally, we provide practical researchers with a numerical toolbox for Bayesian metrology, while theoretical workers will benefit from the broader and more fundamental perspective that arises from the unified character of our methodology.
The widely used quantum Cramér–Rao bound (QCRB) sets a lower bound for the mean square error of unbiased estimators in quantum parameter estimation, however, in general QCRB is only tight in the asymptotical limit. With a limited number of measurements biased estimators can have a far better performance for which QCRB cannot calibrate. Here we introduce a valid lower bound for all estimators, either biased or unbiased, which can serve as standard of merit for all quantum parameter estimations.
In quantum metrology, a major application of quantum technologies, the ultimate precision of estimating an unknown parameter is often stated in terms of the Cramér-Rao bound. Yet, the latter fails to completely characterize the distribution of estimates in the nonasymptotic regime. Optimizing metrology protocols with respect to the Cramér-Rao bound can therefore lead to surprisingly poor finite-sample performance. This can be avoided by quantifying the quality of a metrology protocol by the probability of obtaining an estimate with a given accuracy. Using this intrinsically single-shot quantity naturally accommodates the finite-sample regime. We show that the fundamental limits of this figure of merit can be quantified through a multihypothesis testing problem between quantum states. Building on this connection, we derive an analogue of the Cramér-Rao bound that contains explicit corrections relevant to the finite-sample regime. We apply the finite-sample metrology framework to the example task of phase estimation with an ensemble of spin-1/2 particles, giving unambiguous evidence that large quantum Fisher information does not guarantee that a metrology protocol has a good finite-sample performance. Overall, analyzing the probability of success allows the reliable study of quantum metrology in the finite-sample regime and opens up a plethora of new avenues for research at the interface of quantum information theory and quantum metrology.
In quantum metrology, one of the major applications of quantum technologies, the ultimate precision of estimating an unknown parameter is often stated in terms of the Cramér-Rao bound. Yet, the latter is no longer guaranteed to carry an operational meaning in the regime where few measurement samples are obtained, which we illustrate through a simple example. We instead propose to quantify the quality of a metrology protocol by the probability of obtaining an estimate with a given accuracy. This approach, which we refer to as probably approximately correct (PAC) metrology, ensures operational significance in the finite-sample regime. The accuracy guarantees hold for any value of the unknown parameter, unlike the Cramér-Rao bound which assumes it is approximately known. We establish a strong connection to multi-hypothesis testing with quantum states, which allows us to derive an analogue of the Cramér-Rao bound which contains explicit corrections relevant to the finite-sample regime. We further study the asymptotic behavior of the success probability of the estimation procedure for many copies of the state and apply our framework to the example task of phase estimation with an ensemble of spin-1/2 particles. Overall, our operational approach allows the study of quantum metrology in the finite-sample regime and opens up a plethora of new avenues for research at the interface of quantum information theory and quantum metrology.