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International Symposium on Ultrafast Phenomena and Terahertz Waves (ISUPTW)

Infrared Spectroscopy with Visible Light

Leonid A. Krivitsky, Dmitry A. Kalashnikov, Anna V. Paterova, Shaun Lung, S. P. Kulik

Published Jan 1, 2016• 22 citations
Publisher

Abstract

We present a novel infrared spectroscopy technique, which uses well-developed and low-cost optical components designed for operation in the visible range. The method is based on nonlinear interference of entangled photons generated via spontaneous parametric down conversion. We further advance the technique by developing a data processing algorithm, which eliminates the need for a spectral selection device, which results in the increase of the signal to noise ratio and processing speed.

DOI
10.1364/isuptw.2016.it1a.1

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We present a novel infrared spectroscopy technique, which uses well-developed and low-cost optical components designed for operation in the visible range. The method is based on nonlinear interference of entangled photons generated via spontaneous parametric down conversion. We further advance the technique by developing a data processing algorithm, which eliminates the need for a spectral selection device, which results in the increase of the signal to noise ratio and processing speed.
Infrared (IR) spectroscopy is an indispensable tool for many practical applications including material analysis and sensing. Existing IR spectroscopy techniques face challenges related to the inferior performance and the high cost of IR-grade components. Here, we develop a new method, which allows studying properties of materials in the IR range using only visible light optics and detectors. It is based on the nonlinear interference of entangled photons, generated via Spontaneous Parametric Down Conversion (SPDC). In our interferometer, the phase of the signal photon in the visible range depends on the phase of an entangled IR photon. When the IR photon is traveling through the media, its properties can be found from observations of the visible photon. We directly acquire the SPDC signal with a visible range CCD camera and use a numerical algorithm to infer the absorption coefficient and the refraction index of the sample in the IR range. Our method does not require the use of a spectrometer and a slit, thus it allows achieving higher signal-to-noise ratio than the earlier developed method.
We describe a proof-of-concept of a method for measurement of both real (refraction) and imaginary (absorption) part of the refractive index in the infrared (IR) range by measuring an interference pattern in the visible range without the need for any spectral and spatial selection. The concept is based on nonlinear interference of entangled photons, generated via Spontaneous Parametric Down Conversion (SPDC). In our interferometer, the phase of the signal photon in the visible range depends on the phase of an entangled IR photon. When the IR photon is traveling through the media of interest, its properties can be found from the observations of the visible photon.
We demonstrate a new scheme for infrared spectroscopy with visible light sources and detectors. The technique relies on the nonlinear interference of correlated photons, produced via spontaneous parametric down conversion in a nonlinear crystal. Visible and infrared photons are split into two paths and the infrared photons interact with the sample under study. The photons are reflected back to the crystal, resembling a conventional Michelson interferometer. Interference of the visible photons is observed and it is dependent on the phases of all three interacting photons: pump, visible and infrared. The transmission coefficient and the refractive index of the sample in the infrared range can be inferred from the interference pattern of visible photons. The method does not require the use of potentially expensive and inefficient infrared detectors and sources, it can be applied to a broad variety of samples, and it does not require a priori knowledge of sample properties in the visible range.
Infrared (IR) spectroscopy and imaging are important tools in metrology, including material analysis, sensing and characterization. Although conventional methods of IR metrology are available, they face challenges related to the high cost and low efficiency of IR light sources and photodetectors. These challenges can be addressed by circumventing the need for IR-range components using tools and techniques of quantum optics. In this thesis, we describe a technique for IR measurements, which requires using only accessible light sources and detectors operating in the visible range. Our technique is based on the nonlinear interference of correlated photon pairs generated via spontaneous parametric down conversion (SPDC). In SPDC, a photon from the pump laser generates a pair of correlated photons within a nonlinear crystal. One photon of the pair can be generated in the visible range, and the other in the IR range. Two identical nonlinear crystals pumped by the same laser form the nonlinear interferometer, where interference of the visible SPDC photons can be observed. The interference pattern of the visible photons depends on amplitudes and phases of the IR photons, which are used to probe the properties of the medium under study. Hence, by observing the interference of the visible photons we infer the IR properties of the media, without direct measurements of IR light. We applied the nonlinear interference method to realize the IR spectroscopy, IR optical coherence tomography (OCT), IR imaging and IR polarimetry. In the IR spectroscopy experiment, we simultaneously and independently measured both refractive index and absorption coefficient of various samples in the IR range, while only detecting photons in the visible range. In IR OCT and IR imaging schemes, we measured the reflectivity of the interfaces of the sample, performed 3D raster and wide field imaging through opaque (in the visible range) materials. In the IR polarimetry, we measured the birefringence of the samples. We studied glass, organic polymer, Silicon and CO2 gas, but our method can be applied to a broad variety of samples. Our method is widely tunable and has high precision and accuracy over mid-IR wavelengths. This work paves the way for further practical adoption of the method in the field of IR metrology, without the need for IR grade detectors and sources.
In recent years, nonlinear quantum interferometry has been widely explored for applications like spectroscopy, optical coherence tomography, and imaging [1]. Quantum infrared spectroscopy (QIRS) uses quantum interference of generation processes of frequency-entangled visible-IR photon pairs to perform infrared spectroscopy using visible light sources and silicon-based detectors [2]. This technique utilizes a nonlinear quantum interferometer configuration where the generated IR photons pass through the sample, and the correlated visible photons are detected. The change in the detected visible photon flux with and without the sample helps extract the complex transmittance of the sample in the IR region.
Spontaneous parametric down-conversion is an essential tool for a quantum light source in the infrared region ranging 2-5 µm for the purpose of material identification, chemical analysis, and gas sensing. So far, photon pairs from the process in a nonlinear crystal have low tunability and a narrow spectral range because of the phase-matching condition. Here, we propose a novel type of spontaneous parametric down-conversion processes that overcomes these challenges, where two photon pairs are simultaneously produced in the visible and infrared regions in periodically poled stoichiometric lithium tantalite. It allows broadband and tunable generation of infrared photon pairs that can be employed as an alternative light source for quantum infrared spectroscopy.