Rydberg-Atom-Based Terahertz Reflection System for Full-Field Imaging of Surface Characteristics
X J Li, Yu Wu, Bin Zhang +9 more
Abstract Rydberg-atom–based Terahertz (THz) reflection imaging provides ultra-high sensitivity and, in principle, the potential for MHz-level imaging speed, overcoming the limitations of THz transmission imaging for strongly absorbing samples. Here, we experimentally demonstrate a Rydberg-atom THz reflection imaging system, converting reflected THz fields into visible fluorescence using a cesium vapor cell along the 14 P 3/2 → 13 D 5/2 → 6 P 3/2 pathway, and sequentially imaging the fluorescence with a sCMOS camera. The system achieves clear reflection images with a minimum resolvable line-pair period of approximately 1.26 mm, and a minimum detectable power of 2.41 fW·s -1/2 per (6.5×6.5) μ m 2 pixel. Representative applications include reflection imaging of metallic samples, discrimination of Polar Liquids, and non-contact visualization of superficial human vasculature and finger motion. This system offers a promising route toward high-frame-rate, room-temperature, full-field THz imaging for both industrial and scientific applications.
Chinese Physics B•Jul 17, 2026•0 citations