We use a single-ion electric-field noise sensor in combination with in situ surface treatment and analysis tools, to investigate the relationship between electric-field noise from metal surfaces in vacuum and the composition of the surface. These experiments are performed in a setup that integrates ion trapping capabilities with surface analysis tools. We find that treatment of an aluminum-copper surface with energetic argon ions significantly reduces the level of room-temperature electric-field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The noise levels after treatment are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap at room temperature.
We use a single-ion electric-field noise sensor in combination with in situ surface treatment and analysis tools, to investigate the relationship between electric-field noise from metal surfaces in vacuum and the composition of the surface. These experiments are performed in a setup that integrates ion trapping capabilities with surface analysis tools. We find that treatment of an aluminum-copper surface with energetic argon ions significantly reduces the level of room-temperature electric-field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The noise levels after treatment are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap at room temperature.
We report room-temperature electric field noise measurements combined with in-situ surface characterization and cleaning of a microfabricated ion trap. We used a single-ion electric field noise sensor in combination with surface cleaning and analysis tools, to investigate the relationship between electric field noise from metal surfaces in vacuum and the composition of the surface. These experiments were performed in a novel setup that integrates ion trapping capabilities with surface analysis tools. We find that surface cleaning of an aluminum-copper surface significantly reduces the level of electric field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The post-cleaning noise levels are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap.
All surfaces generate electric-field noise, yet the physical origins of this noise are not well understood. This has been an active area of research in the ion trapping community for the past two decades, as ions are highly sensitive to electric-field fluctuations. With our work, we aim to illuminate the microscopic processes that drive charge dynamics on metal surfaces, so as to enable the engineering of low noise quantum devices. We use single trapped calcium ions as detectors to study the 1/f noise generated by the surfaces of ion traps. We the study this noise by observing how it responds to changes in the properties of the trap surface. The surface properties are altered using treatments including prolonged heating, argon ion milling, and electron bombardment. In situ characterization tools are used to monitor the effects of these treatments. Our measurements are consistent with noise produced by an ensemble of thermally activated fluctuators, so our data is discussed in this context. In this dissertation, we present results from a lengthy series of surface treatment experiments, the majority of which took place on a single aluminum-copper substrate. The results of these experiments indicate that argon ion milling can lower noise both by removing contaminants and by altering the morphology of the trap surface. The effects of morphology are isolated from the effects of contaminant removal via heat treatments, which alter the structure of the surface without changing its chemical composition. Through electron bombardment experiments, we begin an exploration of the relationship between hydrocarbon adsorbate structure and electric-field noise. In addition, we compare the noise characteristics of a set of similarly fabricated traps, and determine that atmosphere exposure has a major impact on noise produced by aluminum-copper films.These experiments establish links between the electric-field noise characteristics and the microscopic properties of a contaminated metal trap surface. The insights we draw in this work can inform the next generation of ion trap engineering, storage, and treatment.
Electric field noise produced by the surface of ion trap electrodes reduces the fidelity of quantum computing operations. Despite decades of investigation its microscopic origins remain unclear.This thesis investigates the origins of surface electric field noise by examining its dependence on trap temperature. A set of Al-Cu surface Paul traps are fabricated together and sent to MIT Lincoln Labs (MITLL) and the University of California, Berkeley (UCB). MITLL measures noise from 7 K to room temperature above a first trap and UCB measures noise from room temperature to 590 K above a second trap. The noise measurements from the two experiments are combined to study the noise dependence over the full temperature range from 7-590 K. This is the largest temperature range ever studied using a single trap design and connects the temperature ranges used in all previous studies.We find qualitatively different behaviors at low and high temperatures: from 7-430 K we find that the noise follows the same power-law scaling reported in previous cryogenic studies. At temperatures from 430-590 K, we find that the noise increases much more rapidly than predicted by the power-law scaling. We note a particularly sharp rise in noise at 560 K, which is similar to the sharp rise in noise reported in a previous high-temperature study of a different Al-Cu trap. To determine which physical processes are associated with the change in noise at elevated trap temperatures, we investigate how the material state of the trap electrodes changes when they are heated. We find that the primary physical process associated with the change in noise at high temperature is thermally-activated atom diffusion within the films.This thesis also investigates if the surface structure of room-temperature Au ion traps affects noise levels. We use a heat treatment to restructure the surface of the traps and measure the resulting change in noise. We find that the heat treatment leads to significant changes to the surface structure but causes only a modest change to noise levels. This indicates that the heat-induced changes to the surface do not strongly affect noise. We also note that the noise magnitude observed above these Au traps is state-of-the-art for room-temperature, untreated surface ion traps. This noise level can be explained by modeling the contamination that exists on the trap surface as a dielectric with a loss tangent of tan θ ≈ 0.01.Finally, this thesis investigates the origin of elevated noise levels in one region of a Au surface ion trap. We find that micron-sized particles are located where noise levels are highest, indicating that these particles are likely responsible for the noise. We can explain the magnitude, frequency, and distance dependence of the noise if we treat the particles as a lossy dielectric with a loss tangent tan θ ≈ 0.3.
Electric-field noise is a major limiting factor in the performance of ion traps and other quantum devices. Despite intensive research over the past decade, the nature and cause of electric field noise near surfaces is not well understood. This dissertation reports the high- temperature dependence of electric-field noise above an Al-Cu surface using a trapped 40Ca+ ion as a probe.We employ a novel setup with a surface ion trap mounted on a heater for studies of the temperature dependence of electric-field noise. To characterize the Al-Cu material, we explore the effects of heat treatment through ex situ annealing followed by inspection in a scanning electron microscope. To calibrate the temperature of the trap, we demonstrate the use of thermal imaging for monitoring the temperature of an ion trap in vacuum.The temperature and frequency dependence of electric-field noise above the surface is measured using the heating rate of a single ion in a surface-electrode Paul trap. We find that the heating rate saturates at temperatures greater than 450 K. We find that the frequency dependence shows a 1/f behavior, and has a lower frequency scaling exponent at high temperatures than at room temperature. We show that these results are a reflection of the surface-related noise by eliminating other possible sources of noise.Building on historical data for resistance fluctuations in thin films, we develop the thermally-activated fluctuator model to describe the results. We find that a broad distribution of fluctuators with energy barriers peaked around 0.5 eV accurately models both the temperature and frequency dependence of the electric-field noise measured. We present the interpretation of this model as a way to infer that the cause of electric-field noise in the trap is likely defect motion in the metal surface, connecting the problems faced in ion trapping to a large body of work in solid state physics.
Electric-field noise from ion-trap electrode surfaces can limit the fidelity of multiqubit entangling operations in trapped-ion quantum information processors and can give rise to systematic errors in trapped-ion optical clocks. The underlying mechanism for this noise is unknown, but it has been shown that the noise amplitude can be reduced by energetic ion bombardment, or “ion milling,” of the trap electrode surfaces. Using a single trapped ⁸⁸Sr⁺ ion as a sensor, we investigate the temperature dependence of this noise both before and after ex situ ion milling of the trap electrodes. Making measurements over a trap electrode temperature range of 4 K to 295 K in both sputtered niobium and electroplated gold traps, we see a marked change in the temperature scaling of the electric-field noise after ion milling: power-law behavior in untreated surfaces is transformed to Arrhenius behavior after treatment. The temperature scaling becomes material-dependent after treatment as well, strongly suggesting that different noise mechanisms are at work before and after ion milling. To constrain potential noise mechanisms, we measure the frequency dependence of the electric-field noise, as well as its dependence on ion-electrode distance, for niobium traps at room temperature both before and after ion milling. These scalings are unchanged by ion milling.
Electric-field noise from ion-trap electrode surfaces can limit the fidelity of multiqubit entangling operations in trapped-ion quantum information processors and can give rise to systematic errors in trapped-ion optical clocks. The underlying mechanism for this noise is unknown, but it has been shown that the noise amplitude can be reduced by energetic ion bombardment, or ``ion milling,'' of the trap electrode surfaces. Using a single trapped 88Sr+ ion as a sensor, we investigate the temperature dependence of this noise both before and after ex situ ion milling of the trap electrodes. Making measurements over a trap electrode temperature range of 4 K to 295 K in both sputtered niobium and electroplated gold traps, we see a marked change in the temperature scaling of the electric-field noise after ion milling: power-law behavior in untreated surfaces is transformed to Arrhenius behavior after treatment. The temperature scaling becomes material-dependent after treatment as well, strongly suggesting that different noise mechanisms are at work before and after ion milling. To constrain potential noise mechanisms, we measure the frequency dependence of the electric-field noise, as well as its dependence on ion-electrode distance, for niobium traps at room temperature both before and after ion milling. These scalings are unchanged by ion milling.