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Springer eBooks

Deflecting and Detecting Atoms with Near-Field Lights

Haruhiko Ito

Published Jan 1, 2013• 0 citations
Publisher
DOI
10.1007/978-3-642-31066-9_27

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Deflecting, focusing, and funnelling atoms by near-field light

Hajime Ito, Kazuo Yamamoto, Akifumi Takamizawa +2 more

We describe atom deflection with a slit-type deflector as an elemental technique of precise atom control using near-field light. In the demonstration experiments, cold Rb atoms deflected by repulsive near-field light induced in a 200?nm-wide slit are detected by means of two-step photoionization. Then, we consider a near-field-light lens of atomic de Broglie waves by developing the atom deflector. The feasibility of nanofocusing is shown by numerical analyses with Fourier atom optics. Finally, we describe atom funnels with evanescent light to generate a cold atomic beam required for atom manipulation using nanometric near-field light. The flux intensity of cold Rb atoms outputted from a 240??m outlet is estimated to be 7.5 ? 107?atom?cm?2?s?1 at a blue detuning of 1.2?GHz. In order to increase the flux intensity to 1012?atom?cm?2?s?1, we develop a Si-made funnel with a micron-sized outlet.

Journal of Optics A Pure and Applied Optics•Mar 23, 2006•7 citations

A slit-type near-field optical detector for neutral atoms with high sensitivity and nanometric resolution

K. Totsuka, Hajime Ito, Tatsurou Kawamura +2 more

Summary form only given. We have proposed deflection by an optical near field on a fiber probe to control atoms with high spatial accuracy. In this case, the deflection angle is estimated to be 0.1 degree for a Rb atom with an incident velocity of 10 m/s. It leads to the deviation of 10 /spl mu/m from the incident axis at 1 cm. in the downstream. To detect the deflected atoms with an accuracy of 1%, we need the spatial resolution of 100 nm. However, a commercial detector such as MCP has a low resolution of 50 /spl mu/m at most and the highest resolution that has been reported is 1 /spl mu/m to our knowledge. In addition, these are applied to metastable atoms and have less detection efficiency for the ground state atoms we manipulate. For drastic improvement, we present here a slit-type atom detector with a nanometric lateral resolution. Since the number of atoms deflected by the optical near field is very small, it is important to detect atoms with high efficiency. For this purpose, we use photoionization with two-color optical near fields.

Quantum Electronics and Laser Science Conference•Nov 13, 2002•0 citations

Near-field atom optics

U. Janicke, Martin Wilkens

European Quantum Electronics Conference (EQEC)•Aug 24, 2005•0 citations
We describe atom deflection with a slit-type deflector as an elemental technique of precise atom control using near-field light. In the demonstration experiments, cold Rb atoms deflected by repulsive near-field light induced in a 200?nm-wide slit are detected by means of two-step photoionization. Then, we consider a near-field-light lens of atomic de Broglie waves by developing the atom deflector. The feasibility of nanofocusing is shown by numerical analyses with Fourier atom optics. Finally, we describe atom funnels with evanescent light to generate a cold atomic beam required for atom manipulation using nanometric near-field light. The flux intensity of cold Rb atoms outputted from a 240??m outlet is estimated to be 7.5 ? 107?atom?cm?2?s?1 at a blue detuning of 1.2?GHz. In order to increase the flux intensity to 1012?atom?cm?2?s?1, we develop a Si-made funnel with a micron-sized outlet.
Summary form only given. We have proposed deflection by an optical near field on a fiber probe to control atoms with high spatial accuracy. In this case, the deflection angle is estimated to be 0.1 degree for a Rb atom with an incident velocity of 10 m/s. It leads to the deviation of 10 /spl mu/m from the incident axis at 1 cm. in the downstream. To detect the deflected atoms with an accuracy of 1%, we need the spatial resolution of 100 nm. However, a commercial detector such as MCP has a low resolution of 50 /spl mu/m at most and the highest resolution that has been reported is 1 /spl mu/m to our knowledge. In addition, these are applied to metastable atoms and have less detection efficiency for the ground state atoms we manipulate. For drastic improvement, we present here a slit-type atom detector with a nanometric lateral resolution. Since the number of atoms deflected by the optical near field is very small, it is important to detect atoms with high efficiency. For this purpose, we use photoionization with two-color optical near fields.