Random tunneling two-level systems (TLSs) in dielectrics have been of interest recently because they adversely affect the performance of superconducting qubits. The coupling of TLSs to qubits has allowed individual TLS characterization, which has previously been limited to TLSs within (thin) Josephson tunneling barriers made from aluminum oxide. Here, we report on the measurement of an individual TLS within the capacitor of a lumped-element LC microwave resonator, which forms a cavity quantum electrodynamics (CQED) system and allows for individual TLS characterization in a different structure and material than demonstrated with qubits. Due to the reduced volume of the dielectric (80 μm3), even with a moderate dielectric thickness (250 nm), we achieve the strong coupling regime as evidenced by the vacuum Rabi splitting observed in the cavity spectrum. A TLS with a coherence time of 3.2 μs was observed in a film of silicon nitride as analyzed with a Jaynes-Cummings spectral model, which is larger than seen from superconducting qubits. As the drive power is increased, we observe an unusual but explicable set of continuous and discrete crossovers from the vacuum Rabi split transitions to the Glauber (coherent) state.
Quantum two-level systems (TLSs) are present in the materials of qubits and are considered defects because they limit qubit coherence. For superconducting qubits, the quintessential Josephson junction barrier is made of amorphous alumina, which hosts TLSs. However, TLSs are not generally understood, either structurally or in atomic composition. In this study, we greatly extend the quantitative data available on TLSs by reporting on the physical dipole moment in two alumina types: polycrystalline $\ensuremath{\gamma}$-
Al2O3 and amorphous a-
AlOx. To obtain the dipole moments
pz, rather than the less-structural coupling parameter
g, we tune individual TLSs with a known external electric field in a cavity quantum electrodynamic system. We find a clear difference in the dipole moment distribution from the film types, indicating a difference in TLS structures. A large sample of approximately 400 individual TLSs are analyzed from the polycrystalline film type. Their dipoles along the growth direction
pz have a mean value of $2.6\ifmmode\pm\else\textpm\fi{}0.3$ debye (D) ($0.54\ifmmode\pm\else\textpm\fi{}0.06\phantom{\rule{0.1em}{0ex}}e$ \AA{}) and standard deviation $\ensuremath{\sigma}=1.6\ifmmode\pm\else\textpm\fi{}0.2\phantom{\rule{0.2em}{0ex}}\mathrm{D}$ ($0.33\ifmmode\pm\else\textpm\fi{}0.03\phantom{\rule{0.1em}{0ex}}e$ \AA{}). The material distribution fits well to a single Gaussian function. Approximately 200 individual TLSs are analyzed from amorphous films. Both the mean ${p}_{z}=4.6\ifmmode\pm\else\textpm\fi{}0.5\phantom{\rule{0.2em}{0ex}}\mathrm{D}$ ($0.96\ifmmode\pm\else\textpm\fi{}0.1\phantom{\rule{0.1em}{0ex}}e$ \AA{}) and $\ensuremath{\sigma}=2.5\ifmmode\pm\else\textpm\fi{}0.3\phantom{\rule{0.2em}{0ex}}\mathrm{D}$ ($0.52\ifmmode\pm\else\textpm\fi{}0.05\phantom{\rule{0.1em}{0ex}}e$ \AA{}) are larger. Amorphous alumina also has very large
pz, greater than
8.6D (
1.8e \AA{}), in contrast to polycrystalline which has none of this moment. These large moments agree only with oxygen-based TLS models. Based on data and the candidate models (delocalized O and hydrogen-based TLSs), we find polycrystalline alumina has smaller ratio of O-based to H-based TLS than amorphous alumina.