NOISE TEMPERATURE AND SENSITIVITY OF A NbN HOT-ELECTRON MIXER AT FREQUENCIES FROM 0.7 THz TO 5.2 THz
Josef Schubert, Alexei D. Semenov, Gregory N Gol'tsman, H.-W. Hübers, Gerhard W. Schwaab, B. Voronov, E. Gershenzon
Abstract
We report on noise temperature measurements of a NbN phonon-cooled hotelectron bolometric mixer at different bias regimes. The device was a 3 nm thick bridge with in-plane dimensions of 1.7 x 0.2 gm 2 integrated in a complementary logarithmic spiral antenna. Measurements were performed at frequencies ranging from 0.7 THz up to 5.2 THz. The measured DSB noise temperatures are 1500 K (0.7 THz), 2200 K (1.4 THz), 2600 K (1.6 THz), 2900 K (2.5 THz), 4000 K (3.1 THz) 5600 K (4.3 THz) and 8800 K (5.2 THz). Two bias regimes are possible in order to achieve low noise temperatures. But only one of them yields sensitivity fluctuations close to the theoretical limit.