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Bulletin of the American Physical Society

Measurement induced dephasing of a superconducting qubit strongly coupled to a resonator

Jay Gambetta, Alexandre Blais, David Schuster, Andreas J. Wallraff, Ren-Shou Huang, Johannes Majer, Luigi Frunzio, S. M. Girvin, Robert J. Schoelkopf

Published Mar 22, 2005• 0 citations
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Dephasing-induced Leakage in Superconducting Qubits

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We have performed spectroscopy of a superconducting charge qubit coupled nonresonantly to a single mode of an on-chip resonator. The strong coupling induces a large ac Stark shift in the energy levels of both the qubit and the resonator. The dispersive shift of the resonator frequency is used to nondestructively determine the qubit state. Photon shot noise in the measurement field induces qubit level fluctuations leading to dephasing which is characteristic for the measurement backaction. A crossover in line shape with measurement power is observed and theoretically explained. For weak measurement a long intrinsic dephasing time of T2>200 ns of the qubit is found.
We theoretically study measurement-induced dephasing of a superconducting qubit in the circuit QED architecture and compare the results to those obtained experimentally by Schuster et al. [Phys. Rev. Lett. 94, 123602 (2005)]. Strong coupling of the qubit to the resonator leads to a significant ac Stark shift of the qubit transition frequency. As a result, quantum fluctuations in the photon number populating the resonator cause dephasing of the qubit. We find good agreement between the predicted line shape of the qubit spectrum and the experimental results. Furthermore, in the strongly dispersive limit, where the Stark shift per photon is large compared to the cavity decay rate and the qubit linewidth, we predict that the qubit spectrum will be split into multiple peaks, with each peak corresponding to a different number of photons in the cavity.
We present a method for detecting electromagnetic (EM) modes that couple to a superconducting qubit in a circuit quantum electrodynamics architecture. Based on measurement-induced dephasing, this technique allows the measurement of modes that have a high quality factor (Q) and may be difficult to detect through standard transmission and reflection measurements at the device ports. In this scheme, the qubit itself acts as a sensitive phase meter, revealing modes that couple to it through measurements of its coherence time. Such modes are indistinguishable from EM modes that do not couple to the qubit using a vector network analyzer. Moreover, this technique provides useful characterization parameters including the quality factor and the coupling strength of the unwanted resonances. We demonstrate the method for detecting both high-Q coupling resonators in planar devices as well as spurious modes produced by a 3D cavity.