Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Optical Dead Time Effects And Sub Poissonion Photo-Electron Counting Statistics
J.G. Walker, Eric Jakeman
Abstract
The use of dead time effects to generate sub-Poissonion photo-electron counting statistics is discussed. An experiment is described in which dead times are introduced using an optical shutter triggered by photo-detection events. Although the triggering photo-electron train is sub-Poissonion and antibunched, the light sampled by a second detector gives rise to a super-Poissonion and bunched train of photo-elecrons. A second experiment is proposed which would generate truly sub-Poisson light (ie detector independent). This is based on the use of optical dead times in parametric fluorescence.