Some properties of spectral line profiles

Toshiharu Tako, Y. Koga, Isao Hirano

O. Yu. Andreev, Leonti N Labzowsky, G. Plunien +1 more

V. V. Yakimets

Nikolai S. Bukhman

It is shown that a spectral gain line narrows down and its profile is normalised with increasing optical thickness of a layer of the amplifying medium. As a result, the gain line profile always becomes Gaussian, independently of the true form factor of the line, when the thickness of the active medium layer is sufficiently large. The normalisation of the line profile is demonstrated for the lines with Lorentzian, Gaussian, and 'time-of-flight' profiles.

Naimu Kuramochi, Takayoshi Matsuo, Isao Matsuda +1 more

Spectral profiles of the 87 Rb D 1 line (λ=794.8 nm) are observed by a Fabry-Perot interferometer for a spherical electrodeless lamp (BBL type) which contains 2.8 Torr of Kr as a starting gas. Temperature dependence of the spectral profiles is measured and the characteristics of the observed profiles such as the intensity, width and self-absorption of each hyperfine component line are discussed. From the convolution calculation, the equivalent half widths are estimated to be 1.05 GHz for the e and the f lines and 1.25 GHz for the c and the d lines when the lamp surface temperature is 80°C.

Manuel P. Cagigal, Felipe González

In this paper we study the behavior of the errors involved in the determination of the parameters characterizing two spectral lines with Gaussian profile by means of the measurement of the intensity correlation function g(2)(τ) and by a multichannel system. The results obtained with both methods are compared. We also compare this results with those obtained when two lines with Lorentzian profile are analyzed.