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Chemical Physics Letters

Linear and nonlinear spectroscopy at a cesium vapour/dielectric interface using a semiconductor laser

M.D. Gibb, Harold K. Haugen

Published Jul 1, 1989• 0 citations
Publisher
DOI
10.1016/0009-2614(89)87535-9

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We present an experimental study of non-linear selective reflection at a dielectric/Cs vapour interface, in a three-level cascade-up scheme. The non-linear reflection at the D 2 resonance line is monitored in the presence of a resonant irradiation at 621 nm or 658 nm (6 P 3/2 → 8 D 5/2 , 9 S 1/2 ). A novel type of two-photon-induced reflection resonances specifically connected with atoms desorbing from the surface is observed. We demonstrate that these resonances allow one to monitor the atomic-velocity distribution at vapour-solid interfaces.