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Physica Scripta

Experimental investigation of two-dimensional arrays of ultrasmall Josephson junctions

C. D. Chen, Per Delsing, David B. Haviland, T. Claeson

Published Jan 1, 1992• 18 citations

Abstract

We have measured Current-Voltage ( I-V ) characteristics of a large number of two-dimensional arrays of small area Al-AlOx-Al junctions down to temperatures of 40 mK, recording the temperature dependence of the zero bias resistance R 0 ( T ). The normal state resistance of the junctions R N varies from 2 kΩ to 270 kΩ and the junction capacitance C from 0.2 f F to 2.2 f F. The arrays are classified into different types according to the E J / E c and the R Q / R N ratios, and mapped onto a parameter diagram. E J is the Josephson coupling energy, E c = e 2 /2 C is the charging energy, and R Q = h /4 e 2 = 6.5 kΩ is the quantum resistance. For low resistance arrays, R Q / R N >> 1 with E J / E c > 1, the Josephson current prevails and the arrays are superconducting. When R Q / R N << 1 and E J / E c < 1, the I-V characteristics show typical Coulomb blockade features. In an intermediate region where R Q / R N similar 0.4, E J / E c similar 0.2, we find a "back-bending" I-V curve with negative differential resistance. The behavior of R 0 ( T ) also falls into three categories which can be correlated with the type of I-V characteristic. At the lowest temperature the arrays appear to be either insulating (d R 0 /d T < 0) or superconducting (d R 0 /d T > 0) depending on whether R N is greater than R Q or less than R Q respectively.

DOI: 10.1088/0031-8949/1992/t42/031

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We have measured Current-Voltage ( I-V ) characteristics of a large number of two-dimensional arrays of small area Al-AlOx-Al junctions down to temperatures of 40 mK, recording the temperature dependence of the zero bias resistance R 0 ( T ). The normal state resistance of the junctions R N varies from 2 kΩ to 270 kΩ and the junction capacitance C from 0.2 f F to 2.2 f F. The arrays are classified into different types according to the E J / E c and the R Q / R N ratios, and mapped onto a parameter diagram. E J is the Josephson coupling energy, E c = e 2 /2 C is the charging energy, and R Q = h /4 e 2 = 6.5 kΩ is the quantum resistance. For low resistance arrays, R Q / R N >> 1 with E J / E c > 1, the Josephson current prevails and the arrays are superconducting. When R Q / R N << 1 and E J / E c < 1, the I-V characteristics show typical Coulomb blockade features. In an intermediate region where R Q / R N similar 0.4, E J / E c similar 0.2, we find a "back-bending" I-V curve with negative differential resistance. The behavior of R 0 ( T ) also falls into three categories which can be correlated with the type of I-V characteristic. At the lowest temperature the arrays appear to be either insulating (d R 0 /d T < 0) or superconducting (d R 0 /d T > 0) depending on whether R N is greater than R Q or less than R Q respectively.

We have measured the current-voltage characteristics of small-capacitance single Josephson junctions at low temperatures ( T< or =0.04 K), where the strength of the coupling between the single junction and the electromagnetic environment was controlled with one-dimensional arrays of dc SQUIDs. We have clearly observed Coulomb blockade of Cooper-pair tunneling and even a region of negative differential resistance, when the zero-bias resistance of the SQUID arrays is much higher than the quantum resistance h/e(2) approximately 26 kOmega. The negative differential resistance is evidence of coherent single-Cooper-pair tunneling in the single Josephson junction.

We have measured the current-voltage $(I\ensuremath{-}V)$ characteristics of small-capacitance single Josephson junctions at low temperatures

(T=0.02--0.6\mathrm{K}),

where the strength of the coupling between the single junction and the electromagnetic environment was controlled with one-dimensional arrays of dc superconducting quantum interence devices (SQUIDs). The single-junction $I\ensuremath{-}V$ curve is sensitive to the impedance of the environment, which can be tuned in situ. We have observed Coulomb blockade of Cooper-pair tunneling and even a region of negative differential resistance, where the zero-bias resistance ${R}_{0}^{\ensuremath{'}}$ of the SQUID arrays is much higher than the quantum resistance ${R}_{K}\ensuremath{\equiv}{h/e}^{2}\ensuremath{\approx}26\mathrm{k}\ensuremath{\Omega}.$ The negative differential resistance is evidence of the coherent single-Cooper-pair tunneling within the theory of current-biased single Josephson junctions. Based on this theory, we have calculated the $I\ensuremath{-}V$ curves numerically in order to compare then with the experimental ones at ${R}_{0}^{\ensuremath{'}}\ensuremath{\gg}{R}_{K}.$ The numerical calculation agrees with the experiments qualitatively. We also discuss the ${R}_{0}^{\ensuremath{'}}$ dependence of the single-Josephson-junction $I\ensuremath{-}V$ curve in terms of the superconductor-insulator transition driven by changing the coupling to the environment.

Josephson junction transistors and 50-junction arrays with linear junction dimensions from 200nm down to 70nm were fabricated from standard Nb∕AlOx∕Nb trilayers. The fabrication process includes electron beam lithography, dry etching, anodization, and planarization by chemical-mechanical polishing. The samples were characterized at temperatures down to 25mK. In general, all junctions are of high quality and their I-U characteristics show low leakage currents and high superconducting energy gap values of Δ≈1.35meV. The characteristics of the transistors and arrays exhibit some features in the subgap area, associated with tunneling of Cooper pairs, quasiparticles, and their combinations due to the redistribution of the bias voltage between the junctions. Total island capacitances of the transistor samples ranged from 1.5fF to 4fF, depending on the junction sizes. Devices made of junctions with linear dimensions below 100nm×100nm demonstrate a remarkable single-electron behavior in both superconducting and normal state. We also investigated the area dependence of the junction capacitances for transistor and array samples.

We have measured the current–voltage characteristics of small-capacitance single Josephson junctions at low temperatures T ≤ 0.04 K, where the strength of the coupling between the single junction and the electromagnetic environment was controlled with one-dimensional arrays of dc SQUIDs. When the zero-bias resistance of the SQUID arrays is much higher than the quantum resistance h/e 2 ≈ 26 kΩ, a transition to a clear Coulomb blockade of Cooper-pair tunnelling is induced in the single junction. The measured blockade voltage agrees with the theoretical prediction.

For the observation of the charging effect on a Josephson junction, the charging energy (E c) must be much larger than the Josephson coupling energy (E J) and thermal energy (k B T). We investigated the properties of submicron-sized Bi2Sr2CaCu2O8+δ intrinsic Josephson junctions (IJJs) at low temperature. The current–voltage curve of IJJs with a junction area of 0.06 µm2 showed a much higher resistance state near the zero bias voltage regions when the measurement temperature decreased to 72.6 mK. The ratios of E c/E J and E c/k B T were 7.04 and 5.78, respectively, which indicates that the charging effect is dominant. In addition, a characteristic voltage structure due to the charging effect in one-dimensional junction array, which is composed of the offset voltage and the threshold voltage of the junction, was observed.

We have investigated how the transport properties of small-Josephson-junction arrays vary depending on a quantum control parameter (the ratio of the Josephson coupling energy E J to the charging energy E C ), the magnitude of dissipation, and the dimensionality d of the system. We found that the arrays show Coulomb blockade behavior when R S is larger than about d R Q ( R Q ≡ h /4 e 2 =6.45 kΩ) and E J / E C is smaller than a threshold depending on the value of R S and the dimensionality. The result is discussed in terms of quantum phase transition induced by the charging effect and the dissipation.