Journal of Physics D Applied Physics
First-order free induction decay in narrow direct-gap semiconductors
Pratima Sen, Kanta Singh, Pratima Sen
Abstract
Using the time-dependent perturbation treatment of the density matrix, the authors report the occurrence of first-order free induction decay (FID) in narrow direct-gap semiconductors. The analysis deals with the interaction of a near resonant, ultrashort, moderate power laser pulse with the bulk semiconductor sample. Numerical estimates have been made for intrinsic InSb of micrometre size at 77 K irradiated by a frequency doubled 10.6 mu m CO 2 laser with pulse duration in the picosecond domain. The results reveal oscillations, around the background values, in the decay profiles of both the refractive index as well as the absorption coefficient. The transient transmitted intensity has been found to decay in a time comparable to the inhomogeneous Doppler broadening time, which is much shorter that the dephasing time. The analytical behaviour reported here is in very good agreement with the experimental observations of first-order FID in the atomic caesium vapour systems.