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Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Fast cooling of trapped ions using the dynamical Stark shift

Alex Retzker, Martin Bodo Plenio

Published Jun 1, 2007• 0 citations
Publisher

Abstract

In this work we present a solution to this problem that relies on the fast Stark shift gate. In this scheme off-resonant carrier transitions that would lead to heating are forbidden thus achieving lower final temperature and a much higher cooling rate.
DOI
10.1109/cleoe-iqec.2007.4386789

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