Physical Review Letters
Critical Behavior of the Contact Process with Parity Conservation
Norio Inui, A. Yu. Tretyakov
Abstract
We introduce a parity conserving version of the contact process, which can be treated using a series expansion technique. Both Pad\'e approximants for the series and numerical simulations for the derivative of the order parameter show that the critical exponent $\ensuremath{\beta}$ is consistent with the conjecture $\ensuremath{\beta}\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}1$. Dynamical Monte Carlo simulations confirm that the model belongs to the branching annihilating random walk with an even number of offsprings universality class.