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American Journal of Physics

Two further experiments on electron interference

G. Matteucci, G. Pozzi

Published Jun 1, 1978• 30 citations
Publisher

Abstract

Two experiments concerning the phenomena of the interference of probabilities and of the so-called Aharonov-Bohm effect have been realized using an electron biprism as interferometric device and a standard electron microscope as electron optical bench. The obtained results are presented.
DOI
10.1119/1.11099

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Electron interference phenomena are now easily observable with the advent of bright and yet coherent field-emission electron beams. The interaction of electron waves with electromagnetic fields is essentially described by the Aharonov–Bohm (AB) effect. However, the AB effect has long been disputed due to a feature that cannot be understood in terms of classical electrodynamics. This paper describes the experiments that confirmed its existence and discusses its expanding applications to the observation of electromagnetic fields in the microscopic region.
The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.