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Soviet Journal of Quantum Electronics

Transverse structure of a field in nonlinear bistable interferometers. III. Dependence of the beam profile on the Fresnel number

Nikolai N Rozanov, Viktor E Semenov, Galina V. Khodova

Published Nov 30, 1983• 5 citations
Publisher

Abstract

A study is made of the influence of a change in the Fresnel number N on hysteresis in nonlinear interferometers. It is shown that at low values of N and for a limited power of the incident radiation there is no hysteresis. An increase in N first gives rise to hysteresis of the power of the transmitted radiation and then to hysteresis of the beam profile. The latter can then be used for multichannel operation.

DOI
10.1070/qe1983v013n11abeh004980

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A study is made of the influence of a change in the Fresnel number N on hysteresis in nonlinear interferometers. It is shown that at low values of N and for a limited power of the incident radiation there is no hysteresis. An increase in N first gives rise to hysteresis of the power of the transmitted radiation and then to hysteresis of the beam profile. The latter can then be used for multichannel operation.
Abstract : The interaction of a light beam with matter has varying degrees of dependence on the transverse profile of the beam. Two topics are considered here. The first topic, superfluorescence, involves the coherent emission generated by an initially inverted two-level medium. Calculations in the past have included either quantum fluctuations in the initial conditions or transverse effects, but never both. The calculations presented here include both transverse effects and quantum fluctuations. The results of the theoretical calculations are in good agreement with previous experimental results, both quantitatively in terms of time delay averages and distributions and also qualitatively in terms of pulse shapes. The second topic considered, optical bistability, involves devices which exhibit two stable output light intensities (a high and a low branch) over a limited range of input light intensities. Simulations performed here show the effect of diffraction, measured in terms of the Fresnel number, on how much of the device becomes bistable. It was found that for small Fresnel number cases, the entire device become bistable. For high Fresnel number cases, only part of the device becomes bistable while the rest of the device remains low transmitting. The results of an experiment performed are consistent with the simulations. (Author)
An experimental investigation was made of the transformation of the intensity profile of a spatially confined light beam transmitted by optical bistable devices based on thin-film semiconductor interferometers formed by vacuum evaporation. A hysteresis of the intensity profile and switching waves was observed: these waves represented the process of consecutive transition from one stable state to another in neighboring zones of the interferometer. An experimental investigation was made of the velocity of switching waves in thin-film interferometers and in a model interferometer with a thermal nonlinearity.