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IEEE Transactions on Magnetics

Observation of microwave synchronization of thin film microbridge arrays

D. W. Jillie, James E. Lukens, Y. H. Kao

Published Mar 1, 1975• 16 citations
Publisher

Abstract

We report on the characteristics of thin film microbridge Josephson junctions fabricated using electron beam lithography and discuss the techniques used to fabricate these junctions, which are typically 0.3μ square. Extensive measurements have been made on both individual junctions of tin and indium and on small arrays of these junctions. Synchronization of current biased series arrays by an applied microwave field has been achieved. This synchronization appears as a zero differential resistance across the entire array at a voltage of MVJwhere M is the number of elements in series and VJis the Josephson voltage hv/2e. Furthermore we have observed a systematic variation with microbridge dimension of the microwave enhancement of the critical current.

DOI
10.1109/tmag.1975.1058683

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We report on the characteristics of thin film microbridge Josephson junctions fabricated using electron beam lithography and discuss the techniques used to fabricate these junctions, which are typically 0.3μ square. Extensive measurements have been made on both individual junctions of tin and indium and on small arrays of these junctions. Synchronization of current biased series arrays by an applied microwave field has been achieved. This synchronization appears as a zero differential resistance across the entire array at a voltage of MVJwhere M is the number of elements in series and VJis the Josephson voltage hv/2e. Furthermore we have observed a systematic variation with microbridge dimension of the microwave enhancement of the critical current.
Current-voltage characteristics and microwave mixing properties of step-edge microbridge Josephson junctions (SEJJs) made of YBaCuO thin films were systematically investigated. The step-edge was formed on the surface of a MgO(100) substrate employing the common photolithograph and wet-etching techniques. YBaCuO thin film was deposited by the off-axis sputtering method, and the microbridge junctions were fabricated so as to cross the step-edge. The SEJJs showed typical DC and AC characteristics which were explained by the resistively shunted junction (RSJ) model. Mixing experiments were carried out in the K-band microwave region. An intermediate frequency (IF) output with the frequency range of 20 MHz~2.0 GHz was successfully obtained.
Current-voltage characteristics and microwave mixing properties of step-edge microbridge Josephson junctions (SEJJs) made of YBaCuO thin films were systematically investigated. The step-edge was formed on the surface of a MgO(100) substrate employing the common photolithograph and wet-etching techniques. YBaCuO thin film was deposited by the off-axis sputtering method, and the microbridge junctions were fabricated so as to cross the step-edge. The SEJJs showed typical DC and AC characteristics which were explained by the resistively shunted junction (RSJ) model. Mixing experiments were carried out in the K-band microwave region. An intermediate frequency (IF) output with the frequency range of 20 MHz∼2.0 GHz was successfully obtained.
We have applied our existing focused ion beam based nanoscale planar SNS bridge junction technology to the fabrication of series arrays, with a view to lumped array applications. Single junctions are created in a micrometre-width bilayer track (125 nm Nb on 75 nm Cu) by milling a trench 50 nm wide in the upper superconducting layer. Individual junctions with non-hysteretic, resistively-shunted current-voltage characteristics, critical current I C ~1 mA and characteristic voltage I C R N ~50 µV at 4.2 K can be fabricated routinely. The characteristics of 10-junction series arrays at junction spacings of 0.2 µm to 1.6 µm have been studied at 4.2 K and above. Locking of all the junctions in the array under an applied microwave field is observed as the transition temperature is approached. This effect is achieved at a lower temperature for shorter junction spacings, suggesting a penetration depth-dependent electromagnetic coupling mechanism. Measurements of differential resistance versus current reveal the I C distribution of individual junctions within the array. Spreads of critical current δ I C = I Cmax / I Cmin ~1.5 at 4.2 K are typically observed. The spread in normal state resistance, R N between junctions is negligible in comparison, as the unbroken normal metal layer shunts all of the junctions in the array. This allows locking to be achieved in spite of the appreciable spread in I C .
An experimental study of small superconducting microbridges in order to examine parameter conditions (i.e., junction resistance and junction inductance) necessary for these junctions to exhibit the Josephson effect is described. Nb variable thickness junctions with very narrow width (<50 nm) and short length (<100 nm) were fabricated using electron beam lithography. The junctions which showed the Josephson effect were thinned by ion beam etching, and consequent changes of junction characteristics were measured. The experimental results indicate that the Josephson effect disappears at some critical resistance. These parameter limits of the Josephson junction are compared with theory.
Voltage locking, defined as the production of an identical non-zero DC voltage in the absence of external microwave radiation across each Josephson junction of an array, has been observed in two microbridge Josephson junctions separated by a 2μm wide strip of superconductor. Voltage locking occurs when the bridges are biased with the current flowing in opposing directions thru the bridges and out the strip connecting them. The voltage across each bridge can be pulled over 1μV until each bridge displays an identical non-zero voltage, with the total voltage across both bridges equal to zero. Full locking, as defined above, is observed in excess of 40μV. The voltage and temperature dependence of the locking is described.