The temperature (
T)-shift protcol of aging in the 3 dimensional (3D) Edwards- Anderson (EA) spin-glass (SG) model is studied through the out-of-phase component of the ac susceptibility simulated by the Monte Carlo method. For processes with a small magnitude of the
T-shift,
ΔT, the memory imprinted before the
T-shift is preserved under the
T-change and the SG short-range order continuously grows after the
T-shift, which we call the cumulative memory scenario. For a negative
T-shift process with a large
ΔT the deviation from the cumulative memory scenario has been observed for the first time in the numerical simulation. We attribute the phenomenon to the `chaos effect' which, we argue, is qualitatively different from the so-called rejuvenation effect observed just after the
T-shift.