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Chinese Physics

Selective reflection combined with Fabry–Perot effects from two-level atoms confined between two dielectric walls

Yuanyuan Li, Zhou Yu, Guizhong Zhang

Published May 1, 2006• 10 citations
Publisher

Abstract

The coefficient of selective reflection at oblique incidence from two-level atoms confined between two dielectric walls is calculated in this paper. It is found to be related to the transient behaviour of atoms after colliding with the wall and the distribution of the field inside the vapour corresponds to L /λ, with L the thickness of the film and λ the incident wavelength. We find that the sub-Doppler structure is manifest both for normal incidence and small angle oblique incidence. It is feasible to detect the real part of selective reflection in several cases that have not been achieved before.

DOI
10.1088/1009-1963/15/5/020

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The coefficient of selective reflection at oblique incidence from two-level atoms confined between two dielectric walls is calculated in this paper. It is found to be related to the transient behaviour of atoms after colliding with the wall and the distribution of the field inside the vapour corresponds to L /λ, with L the thickness of the film and λ the incident wavelength. We find that the sub-Doppler structure is manifest both for normal incidence and small angle oblique incidence. It is feasible to detect the real part of selective reflection in several cases that have not been achieved before.
The absorption spectroscopy of atomic vapor film between two dielectric walls with Fabret-Perot effects eliminated(the second surface is ideally antireflection coated) is theoretically studied.It is found that the line-shapes of absorption exhibit a Dicke-narrowing structure in several cases are strongly modified by the incident angle of the field and the ratio of L/λ,where L is the thickness of the film and λ the incident wavelength.As an example,we also discussed the magnitude and the linewidth of absorption versus the incident angle for L/λ=1/2.
This paper investigates the absorptive reduction and the width narrowing of electromagnetically induced transparency (EIT) in a thin vapour film of λ-type atoms confined between two dielectric walls whose thickness is comparable with the wavelength of the probe field. The absorptive lines of the weak probe field exhibit strong reductions and very narrow EIT dips, which mainly results from the velocity slow-down effects and transient behaviour of atoms in a confined system. It is also shown that the lines are modified by the strength of the coupling field and the ratio of L/λ, with L the film thickness and λ the wavelength of the probe field. A simple robust recipe for EIT in a thin medium is achievable in experiment.
We calculate the modulation of the reflection coefficient for a frequency-modulated (FM) light beam incident on the interface between a dielectric and an atomic vapor. The vapor is described as a gas of resonant, Doppler-broadened, two-level systems, with transition frequency and linewidth arbitrarily depending on the atom-dielectric distance. The atoms are supposed to get deexcited at collisions with the surface. The transient atomic response is calculated to first order in the incident field, for both incoming and desorbed atoms. The reflection coefficient, evaluated to first order in the vapor dipole polarization, leads to a formal expression of the reflectivity modulation, valid for arbitrary atom-surface interaction potentials. One first discusses the reflection signal in absence of wall interactions, for arbitrary modulation frequencies. At large frequencies, it allows one to monitor both vapor absorption and dispersion. Second, the formal theory is applied to the case of a Van der Waals-London surface attraction exerted on the atomic vapor. Both normal and oblique beam incidences are considered. One shows how the vapor dispersion signal is red-shifted and strongly distorted by the appearance of vapor-surface long-range interactions, and how it can be used to monitor these interactions. At non-normal incidences, the lineshapes get Doppler-broadened.
Transmission sub-Doppler spectroscopy with confined atomic vapor film between two dielectric walls is theoretically studied. Because of atoms flying from wall to wall, where they get de-excited, the atom-field interaction time is anisotropic so that the contribution of slow atoms is enhanced, a sub-Doppler transmission spectroscopy (Dicke narrowing effect) can be obtained when the thickness of the film is much small or comparable with the wavelength even at small angle oblique incidence. It is feasible to get a sub-Doppler structure in a new region (L < ?/4) in experiments.
Transmission sub-Doppler spectroscopy with confined atomic vapor film between two dielectric walls is theoretically studied. Because of atoms flying from wall to wall, where they get de-excited, the atomfield interaction time is anisotropic so that the contribution of slow atoms is enhanced, a sub-Doppler transmission spectroscopy (Dicke narrowing effect) can be obtained when the thickness of the film is much small or comparable with the wavelength even at small angle oblique incidence. It is feasible to get a sub-Doppler structure in a new region (L ＜λ/4) in experiments.
Understanding the processes underlying the optical excitation of atomic vapor in the vicinity of solid surfaces is of interest both from physical and technical points of view. Selective reflection spectra of laser light from an interface of a transparent dielectric material and resonant vapor are known to be Doppler-free and to provide important spectroscopic information about the atom-wall interaction. On the other hand, atomic vapors have such a large and fast nonlinear response on or near resonances that they are capable of processing signals and images with milliwatt lasers at a time scale of submicroseconds. In the present paper we investigate linear and nonlinear optical properties of a thin film of atomic vapor confined between two solid surfaces. Assuming two-level atoms, we solve the Maxwell- Bloch equations for light reflection from resonant atoms. The interaction between the resonant atoms and the wall is accounted for through the boundary conditions for all elements of density matrix. The transient polarization is shown to make an important contribution not only to the field structure in the vicinity of the wall but also to the interference pattern of the reflected field. It is found that the spectrum of reflection depends remarkably on the film thickness. Strong enhancement of signal is also found from this study and possible devices for the detection are discussed.