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Physical Review A

Slow-light dynamics from electromagnetically-induced-transparency spectra

Mason Klein, Michael Hohensee, Yanhong Xiao, R. Kalra, D. F. Phillips, R. L. Walsworth

Published May 18, 2009• 23 citations
Publisher

Abstract

We show how slow-light pulse delays in realistic electromagnetically-induced-transparency (EIT) media can be determined directly from static transmission spectra. Using only the measured EIT linewidth and off-resonant transmission, the absolute delay of a slow-light pulse in an optically thick, power-broadened medium can be simply and accurately determined, while capturing more complex optical pumping behavior.

DOI
10.1103/physreva.79.053833

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Physical Review A•Jul 2, 2007•24 citations
We show how slow-light pulse delays in realistic electromagnetically-induced-transparency (EIT) media can be determined directly from static transmission spectra. Using only the measured EIT linewidth and off-resonant transmission, the absolute delay of a slow-light pulse in an optically thick, power-broadened medium can be simply and accurately determined, while capturing more complex optical pumping behavior.
We show that the Electromagnetically Induced Transparency (EIT) is possible in a medium exhibiting Rydberg excitons and indicate the realistic parameters to perform the experiment. The calculations for a Cu2_22​O crystal are given which show that in this medium due to large group index one could expect slowing down a light pulse by a factor about 10410^4104.
We describe the temporal and spatial dynamics of propagating electromagnetically induced transparency pulses in an optically thick medium. Results include pulse velocities as slow as c/165c/165c/165 with 55% transmission, strong-probe-field effects, and the observation of near diffraction-limited transmitted beam quality.
We calculate the line shape and linewidths for electromagnetically induced transparency (EIT) in optically thick, Doppler broadened media (buffer gasses are also considered). In generalizing the definition of the EIT linewidth to optically thick media, we find two different linewidth definitions apply depending on whether the experiment is pulsed or continuous wave (cw). Using the cw definition for the EIT line shape we derive analytic expressions describing the linewidth as a function of optical depth. We also review the EIT line shapes in optically thin media and provide physical arguments for how the line shapes change as a function of various parameters.