Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
Error-resistant Single Qubit Gates with Trapped Ions
Nuala Timoney, Vladimir Elman, C. Weiss, M. Johanning, C. Wunderlich, Werner Neuhauser
Abstract
This study presents single qubit gates with trapped ions that are robust against experimental imperfections over a wide range of parameters. In particular it is shown that errors caused by an inaccurate setting of either frequency, amplitude, or duration of the driving field, or of a combination of these errors are tolerable when a suitable sequence of radiation pulses, or a shaped pulse is applied instead of, for instance, a single rectangular pi-pulse. Thus an essential prerequisite for scalable quantum computation with trapped ions is demonstrated.