We report experimental results on the dc and ac characterization of multiterminal SFIFSIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively), which display transistor-like properties. We investigated two types of such superconducting-ferromagnetic transistors (SFTs): ordinary devices with a single acceptor (SIS) junction, and devices with a double acceptor. The devices with the single SIS acceptor were investigated and demonstrated a modulation of the maximum Josephson current as a function of the SFIFS current injection level. For devices of the second type, by applying an ac signal (in the kilohertz range) with a constant dc bias current to the injector (SFIFS) junction, we observed a voltage gain of about 25 on the double acceptor with the operating point chosen in the subgap region of the acceptor current-voltage characteristic. We also observed an excellent input-output isolation in our SFIFSIS devices. The experiments indicate that, after optimization of the device parameters, they can be used as input/output isolators and amplifiers for memory, digital, and RF applications.
We report experimental results on the dc and ac characterization of multiterminal SFIFSIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively), which display transistor-like properties. We investigated two types of such superconducting-ferromagnetic transistors (SFTs): ordinary devices with a single acceptor (SIS) junction, and devices with a double acceptor. The devices with the single SIS acceptor were investigated and demonstrated a modulation of the maximum Josephson current as a function of the SFIFS current injection level. For devices of the second type, by applying an ac signal (in the kilohertz range) with a constant dc bias current to the injector (SFIFS) junction, we observed a voltage gain of about 25 on the double acceptor with the operating point chosen in the subgap region of the acceptor current-voltage characteristic. We also observed an excellent input-output isolation in our SFIFSIS devices. The experiments indicate that, after optimization of the device parameters, they can be used as input/output isolators and amplifiers for memory, digital, and RF applications.
We report experimental results on characteristics of SFIFS junctions and multi-terminal SFIFSIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively). The SFIFS junctions serve as injectors in the SFIFSIS devices which have transistor-like properties; for this reason we call them Superconducting-Ferromagnetic Transistors (SFTs). We have found the F (Ni) thickness at which the SFIFS current-voltage characteristic (CVC) becomes linear. Furthermore, we investigated the DC and AC characteristics of SFTs of two types: ordinary devices with a single acceptor (SIS) junction, and devices with a double acceptor. In the first case, we focused on studying the influence of the injection current through the SFIFS junction on the maximum Josephson current of the SIS acceptor. For devices of the second type, we studied voltage amplification properties when the operating point was chosen in the sub-gap region of the acceptor CVC. By applying an AC signal (in the kHz range) while biasing the injector (SFIFS) junction with a constant DC current, we observed a voltage gain above 25 on the double acceptor. In the reverse transmission experiment, we applied DC current and an AC modulation to the acceptor junction and, within the accuracy of the experiment, observed no response on the injector junction, which implies an excellent input-output isolation in our SFIFSIS devices. The experiments indicate that, after optimization of the device parameters, they can be used as input/output isolators and amplifiers for memory, digital, and RF applications.
We report experimental results of the DC and RF characterization of multi-terminal SFIFSIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively), which display transistor-like properties. Applying a 0.2 MHz signal in addition to a constant DC bias current to the injector (SFIFS) junction, we observe a voltage gain of ~1.25 on the acceptor SIS junction, if operation point of the SIS junction is chosen in the sub-gap region of its current-voltage characteristic. We also observed a good input-output isolation of our SFIFSIS devices of the order of 30 dBV. The experiments indicate that, after optimization of the geometry and improvement of junction quality, these devices can be used as input-output isolators and amplifiers for memory, digital and RF applications.
We report experimental results on characteristics of SFIFS junctions and multiterminal SFIFSIS and SISFIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively). The SFIFS (SFIS) junctions serve as injectors in the SFIFSIS (SISFIS) devices, which have transistorlike properties; for this reason, we call them superconducting-ferromagnetic transistors. We have found the F (Ni) thickness at which the SFIFS current-voltage characteristic becomes linear. For three-terminal SFIFSIS devices, we focused on studying the influence of the injection current through the SFIFS junction on the maximum Josephson current of the SIS acceptor. For four-terminal SISFIS devices, we studied dependence of the transport current through the middle Nb electrode on injection current level through the SFIS junction. In both cases, we found that the output superconducting current (either Josephson or transport) can be efficiently modulated by the quasiparticle injection from SFIFS or SFIS input junction. The experiments indicate that, after optimization of the device parameters, they can be used as input/output isolators and amplifiers for memory, digital, and RF applications.
We report on the measurement results of the superconducting-ferromagnetic transistors (SFTs). The devices were made at Northwestern University and Hypres (SeeQC), Inc. (Nevirkovets et al., 2014; 2015). SFT is a multiterminal device with the SIS'FIFS (or SFIFS'IS) structure (where S, I, and F denote a superconductor, an insulator, and a ferromagnetic material, respectively) exploiting intense quasiparticle injection in order to modify the nonlinear I-V curve of a superconducting tunnel junction. SFT is capable of providing voltage, current, and power amplification while having good input/output isolation. We characterized the devices using different measurement techniques. We measured S parameters of the single- and double-acceptor devices at frequencies up to 5 MHz. Importantly, we confirmed that the isolation between the input and output of the device is quite good. However, the techniques typically employed to characterize semiconductor devices do not allow for revealing the full potential of our low-resistive SFT devices, especially those having two acceptors. In the latter case, we also tested the devices using the battery-powered current sources with floating grounds. Analyzing double-acceptor I-V curves recorded at different levels of injection currents, for an optimal load, we deduced a small-signal voltage gain of 33 and a power gain of 2.4. We suggest that further improvement of the SFT device parameters is possible in optimized devices, so that the device potentially may serve as a preamplifier for readout of output signals of cryogenic detectors and be useful as an element of other superconductor-based circuits. In addition, we used scanning transmission electron microscopy to identify some problems in the fabrication of the devices without any planarization.
We report experimental and theoretical results on the current gain in superconductor-ferromagnetic transistors (SFTs) with the SISFIFS structure [where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively]. The Josephson critical current density jcaof the acceptor (SISF) junction in the devices is above 9 kA/cm2, which is higher than that in our previous devices. The critical current gain is defined as |δIca|/|δIi|, where a change |δIi| in the injector (SFIFS junction) current produces a change |δIca| in the acceptor maximum Josephson current. We observed a small-signal gain as high as 7.8 and a large-signal current gain of about 2.2. In addition, we found that the Josephson current of the acceptor junction is sensitive to the state of the ferromagnetic layers. A theoretical model is proposed to describe the nonequilibrium processes in the SFT devices, which agrees with the experimental observations. The calculation shows that, in the present device configuration, the dominant contribution to the gap suppression in the middle Nb electrode is due to the quasiparticle injection; spin injection plays a secondary role. We demonstrate that proper device engineering allows one to efficiently control the maximum Josephson current in the SISF acceptor junction using the quasiparticle injection. We conclude that SFT devices can be used as input/output isolators and amplifiers for memory, digital, and RF applications.
The superconductor-ferromagnetic transistors (SFTs) with the SISFIFS structure (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively) are promising for various applications in superconducting electronics. Specifically, as current amplifiers, they can be used as line drivers and cell selectors in cryogenic memory. Here we report on results of a study of dependence of current gain on the SFIFS injector and SIS acceptor barrier transparency. We demonstrate that making the acceptor junction much more transparent than the injector junction results in improvement of the current gain; in particular it can exceed unity. Therefore proper device engineering allows one to efficiently control the maximum Josephson current in the SIS acceptor junction using the quasiparticle injection.