Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

The European Physical Journal D

Atom interferometry measurement of the atom-surface van der Waals interaction

S. Lepoutre, Vincent Lonij, Haikel Jelassi, G. Trénec, M Büchner, Alexander D. Cronin, J. Vigué

Published Mar 25, 2011• 23 citations
Publisher
DOI
10.1140/epjd/e2011-10584-7

Related papers

Measurement of the van der Waals interaction between two atoms

Antoine Browaeys

•Aug 25, 2013•0 citations

Precision measurements of Van der Waals atom-surface potentials using nano-gratings

Vincent Lonij, Cathy Klauss, Will Holmgren +1 more

Bulletin of the American Physical Society•Mar 16, 2010•0 citations

Atomic Physics in Confined Space: Suppressing Spontaneous Emission at Optical Frequencies and Measuring the Van der Waals Atom-Surface Interaction

S. Haroche, A. Anderson, E. A. Hinds +2 more

Springer series in optical sciences/SPringer series in optical sciences•Jan 1, 1987•0 citations

Using atom optics to measure van der Waals atom-surface interactions

John D. Perreault

Atom-surface interactions are becoming an integral part of the field of atom optics. Here the role of van der Waals atom-surface interactions in atom wave diffraction and interferometry are investigated. In particular, it is shown that van der Waals interactions influence the intensity and phase of atomic diffraction patterns obtained from material gratings. As a result the atomic diffraction patterns are utilized to make an accurate determination of the interaction strength and verify the spatial variation of the atom-surface potential. A theory for describing the modified atom wave diffraction patterns is developed through an analogy with optical waves. An atom interferometer is used to directly measure the de Broglie wave phase shift induced by atom-surface interactions. More specifically, the phases of the zeroth, first, and second diffraction orders are measured. A proposal for using electromagnetic fields to modify the van der Waals interaction is put forth. Several of the important experimental components for observing such an effect are also demonstrated.

•Jan 1, 2005•0 citations

Measurement of atom-surface interactions by atom interferometry

M Büchner

•Jun 1, 2010•0 citations

Schlieren Nanoscope in Atom Optics

Jules Grucker, J.‐C. Karam, Valerij Bočvarski +4 more

One proposes the equivalent of Schlieren photography in atom interferometry. It is based on van der Waals inelastic diffraction by a material surface, in which the atom internal state (i.e., Zeeman sublevel) is modified by the surface interaction. Inelastic diffraction by two close wires, or the two surfaces of a slit, leads to non-localised atom interferences, the amplitude of which is sensitive to van der Waals interactions in the nanometer range. Implementation of this atom nanoscope on cooled metastable Ar* beam will be presented.

Quantum-Atom Optics Downunder (QAO)•Jan 1, 2007•0 citations
Atom-surface interactions are becoming an integral part of the field of atom optics. Here the role of van der Waals atom-surface interactions in atom wave diffraction and interferometry are investigated. In particular, it is shown that van der Waals interactions influence the intensity and phase of atomic diffraction patterns obtained from material gratings. As a result the atomic diffraction patterns are utilized to make an accurate determination of the interaction strength and verify the spatial variation of the atom-surface potential. A theory for describing the modified atom wave diffraction patterns is developed through an analogy with optical waves. An atom interferometer is used to directly measure the de Broglie wave phase shift induced by atom-surface interactions. More specifically, the phases of the zeroth, first, and second diffraction orders are measured. A proposal for using electromagnetic fields to modify the van der Waals interaction is put forth. Several of the important experimental components for observing such an effect are also demonstrated.
One proposes the equivalent of Schlieren photography in atom interferometry. It is based on van der Waals inelastic diffraction by a material surface, in which the atom internal state (i.e., Zeeman sublevel) is modified by the surface interaction. Inelastic diffraction by two close wires, or the two surfaces of a slit, leads to non-localised atom interferences, the amplitude of which is sensitive to van der Waals interactions in the nanometer range. Implementation of this atom nanoscope on cooled metastable Ar* beam will be presented.