Journal of Applied Physics
Spreading of damage in ferromagnetic thin films: Profiles and temporal evolution
ANA VITóRIA LAURINDO DE LIMA, M. L. Lyra, U.M.S. Costa
Abstract
We numerically investigate the critical behavior of layered S=1/2 Ising ferromagnetic thin films with an enhanced surface coupling constant by using the spreading of damage technique through the Metropolis dynamics. We obtain that near the bulk critical spreading temperature, the Hamming distance profile changes its shape from a positive curvature profile for Js/J<1.4 to a negative curvature profile for Js/J>1.4, which is a signature of the reminiscent special surface-bulk transition which occurs in the semi-infinite system. Furthermore, we show that the temporal evolution of the damage front exhibits a typical exponential growth above critically while in the critical region the behavior is diffusive.