Journal of Applied Physics
rf current dependence of the 8.9-GHz impedance of tantalum point-contact Josephson junctions
David E. Claridge
Abstract
The complex rf impedance of tantalum point-contact Josephson junctions at 8.9 GHz has been measured as a function of the dc bias current for several values of rf current amplitude. The experimental results agree qualitatively with the predictions of the resistively-shunted-junction model, but discrepancies between the experimental results and the theory suggest that this model does not adequately predict all of the impedance properties of these junctions.