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Quantum Information and Computation

Estimation of the heating rate of ions due to laser fluctuations when implementing quantum algorithms

Shingo Fujiwara, Shuichi Hasegawa

Published Sep 1, 2007• 0 citations
Publisher

Abstract

We analyze numerically the heating of trapped ions due to laser intensity and phase fluctuations when implementing Grover's algorithm and the Quantum Fourier Transform. For a simpler analysis we assume that the stochastic processes are white noise processes and average over each noise as in [Phys. Rev. A. \textbf{57}, 3748, (1998)]. We investigate the fidelity and the heating rate for these algorithms using parameters estimated from experiments, and we can see the order of magnitude difference in the heating rate depending on the quantum algorithms.

DOI
10.26421/qic7.7-1

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We analyze numerically the heating of trapped ions due to laser intensity and phase fluctuations when implementing Grover's algorithm and the Quantum Fourier Transform. For a simpler analysis we assume that the stochastic processes are white noise processes and average over each noise as in [Phys. Rev. A. \textbf{57}, 3748, (1998)]. We investigate the fidelity and the heating rate for these algorithms using parameters estimated from experiments, and we can see the order of magnitude difference in the heating rate depending on the quantum algorithms.
Summary form only given.To model the decoherence in ion traps resulting from laser intensity and phase fluctuations, we assume that the stochastic processes involved are white noise processes, which enables us to give a simple master equation description of this source of decoherence. We discuss the effects those fluctuations have on gate operations in ion-trap quantum computation and briefly address possible detection and error correction mechanisms. The master equation is then averaged over the noise and is sufficient to describe the results of experiments that probe the oscillations in the electronic populations as energy is exchanged between the internal and electronic motion. We get solutions for the probability of the ion to be in the ground state for both intensity and phase fluctuations. Our results predict that the decoherence rate resulting from intensity fluctuations will depend on the vibrational quantum number in different ways depending on which vibrational excitation sideband is used. So the dependence of the decoherence rate for the second red sideband depends quadratically on the vibrational energy state |n> the ion is prepared in, whereas for the first sideband, this effect is linear in n. Due to this result, the second red (or any higher-order) sideband is a better choice for testing the dependence of decoherence on the excitation in the vibrational state experimentally than just the first-order sideband. Because those fluctuations in the exciting laser pulse are not the only source of decoherence, we briefly discuss fluctuations in the trap potential itself. These fluctuations lead to a wobbling trap center point, and we discuss the effects due to them.
We consider one source of decoherence for a single trapped ion due to intensity and phase fluctuations in the exciting laser pulses. For simplicity we assume that the stochastic processes involved are white noise processes, which enables us to give a simple master equation description of this source of decoherence. This master equation is averaged over the noise, and is sufficient to describe the results of experiments that probe the oscillations in the electronic populations as energy is exchanged between the internal and electronic motion. Our results are in good qualitative agreement with recent experiments and predict that the decoherence rate will depend on vibrational quantum number in different ways depending on which vibrational excitation sideband is used.
We solve a stochastic master equation based on the theory of Savard et al. [T. A. Savard, K. M. O'Hara, and J. E. Thomas, Phys. Rev. A 56, R1095 (1997)] for heating arising from fluctuations in the trapping laser intensity. We compare with recent experiments of Ye et al. [J. Ye, D. W. Vernooy, and H. J. Kimble, Phys. Rev. Lett. 83, 4987 (1999)], and find good agreement with the experimental measurements of the distribution of trap occupancy times. The major cause of trap loss arises from the broadening of the energy distribution of the trapped atom, rather than the mean heating rate, which is a very much smaller effect.
High-fidelity two-qubit entangling gates are essential for the realization of useful quantum algorithms on quantum processors. The Mølmer-Sørensen (MS) gate has become a common choice for trapped-ion quantum computing due to its resilience to ion temperature and its demonstrated record fidelities. However, the spectral impurity of the driving laser field impacts gate performance, with phase noise influencing the qubit dynamics through mechanisms operating on different timescales. In this work, we present a comprehensive theoretical analysis of laser phase noise in the MS gate, identifying two spectral ranges which influence the gate fidelity the most: "fast" noise at frequencies near the motional mode spectrum, and "slow" noise at frequencies on the order of the inverse gate time. We derive the noise Hamiltonians for two common laser beam geometries and obtain analytical expressions for the average gate error in terms of the laser noise power spectral density and gate parameters. For slowly varying noise spectra, we provide simplified error estimates. In addition, we validate our findings against previously published numerical simulations.
We have investigated motional heating of laser-cooled 9Be+{}^{9}{\mathrm{Be}}^{+}9Be+ ions held in radio-frequency (Paul) traps. We have measured heating rates in a variety of traps with different geometries, electrode materials, and characteristic sizes. The results show that heating is due to electric-field noise from the trap electrodes that exerts a stochastic fluctuating force on the ion. The scaling of the heating rate with trap size is much stronger than that expected from a spatially uniform noise source on the electrodes (such as Johnson noise from external circuits), indicating that a microscopic uncorrelated noise source on the electrodes (such as fluctuating patch-potential fields) is a more likely candidate for the source of heating.