Compatible Statistical Interpretation of Interference in Double-Slit Interferometer

Marco Minozzo

Thomas A. Smith, Yanhua H. Shih

This article reports a study on a turbulence-free Young's double-slit interferometer. When the environmental turbulence blurs out the classic Young's double-slit interference completely, a two-photon interference pattern is still observable from the measurement of intensity or photon number fluctuation correlation. This two-photon interferometer always produces a turbulence-free interference pattern, when the double-slit interferometer is utilizing both first-order spatially incoherent light and spatially coherent light. This type of two-photon interferometer establishes new capabilities in optical observations and sensing measurements that require high sensitivity and stability.

Deepak Kumar

Itamar Vidal, E. J. S. Fonseca, Jandir M. Hickmann

We report on the diffraction and interference of entangled photons by a distributed double slit using a non-local interferometer, with the double slit being created using two different and spatially separated apertures.

Hui Peng

The interference and the diffraction are two basic phenomena in physical optics. It has been shown that: in the experiment of a double slit, the patterns depend on the shape of the double slit, e.g., a non-parallel double slit produces the hybrid pattern, the interference pattern embedded in the diffraction pattern; a curved double slit produces Point-Symmetry-Interference-Patterns. In this paper, we show for the first time the pattern evolution of a curved double slit experiment: near the curved double slit, the pattern is Pre-Particle pattern (at L = 10 mm), then evolve sequentially to Particle pattern (at L = 60 mm), to Transition pattern-1 (at L = 130 mm), to Arc-interference-pattern (at L = 200 mm), to Transition pattern-2 (at L = 400 mm), and finally, to Point-Symmetry-interference-pattern (at L = 900 mm) which has the point symmetry. We interpret Arc-interference-pattern (at L = 200 mm) in Section 3, and show the curvature dependence of Point-symmetry interference patterns. It is challenge to interpret Point-Symmetry-interference-pattern (at L = 900 mm), and to interpret pattern evolution.

F.J. Duarte, D. J. Paine