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Bulletin of the American Physical Society

Measurement of environmental impedance at plasma frequency of Josephson junctions with microwave induced escapes

Bo Mao, Siyuan Han

Published Mar 13, 2006• 0 citations
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We have investigated macroscopic quantum tunneling in Bi(2)Sr(2)CaCu(2)O(8 + delta) intrinsic Josephson junctions at millikelvin temperatures using microwave irradiation. Measurements show that the escape rate for uniformly switching stacks of Nu junctions is about Nu(2) times higher than that of a single junction having the same plasma frequency. We argue that this gigantic enhancement of the macroscopic quantum tunneling rate in stacks is boosted by current fluctuations which occur in the series array of junctions loaded by the impedance of the environment.
We investigate, by experiments and numerical simulations, thermal activation processes of Josephson tunnel junctions in the presence of microwave radiation. When the applied signal resonates with the Josephson plasma frequency oscillations, the switching current may become multivalued in a temperature range far exceeding the classical to quantum crossover temperature. Plots of the switching currents traced as a function of the applied signal frequency show very good agreement with the functional forms expected from Josephson plasma frequency dependencies on the bias current. Throughout, numerical simulations of the corresponding thermally driven classical Josephson junction model show very good agreement with the experimental data.