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Observation of atomic relaxation near an interface through detection of emitted fluorescence
Henk F. Arnoldus, Thomas F. George
Abstract
Abstract : In this Comment we discuss the general features of spontaneous decay of an atom which is close to the surface of a dielectric (or metal) layer, and this is compared to atomic decay near a four-wave mixing phase conjugator. It is pointed out that the decay or relaxation constants can be expressed entirely in terms of the classical Fresnel coefficients for reflection and transmission of a plane wave, independent of what the explicit forms of these coefficients are. For decay near a dielectric the relaxation constants can be measured directly by counting the number of fluorescent photons per unit of time, after excitation by a laser. For relaxation near a phase conjugator this procedure would require a spectral resolution in the photon detection, since there are two distinct contributions to the fluorescent yield of a two-state atom. The two possible decay mechanisms have different relaxation constants and produce radiation with different frequencies. Atomic relaxation, Near an interface, Emitted fluorescence, Classical fresnel coefficients, Phase conjugator, Four-wave mixing. (jes)