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Bulletin of the American Physical Society

Diffusion of atomic coherence in atomic vapor cells

David H. Phillips, Yanhong Xiao, Irina V. Novikova, Ronald Lee Walsworth

Published May 19, 2005• 0 citations
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We present a new characterisation technique for atomic vapor cells, combining time-domain measurements with absorption imaging to obtain spatially resolved information on decay times, atomic diffusion and coherent dynamics. The technique is used to characterise a microfabricated Rb vapor cell, with N2buffer gas, placed inside a microwave cavity. High-resolution images of the population (T1) and coherence (T2) lifetimes in the cell are presented. Atom-wall collisions and atomic diffusion result in a `skin' of reduced T1and T2times around the edge of the cell. The technique also allows polarisation-resolved imaging of the microwave magnetic field inside the cell. Our technique is useful for vapor cell characterisation in atomic clocks, atomic sensors, and quantum information experiments.
The diffusion crosstalk free distance is an important parameter for spin images in atomic vapor cells and is also regarded as a limit on the spatial resolution. However, by modulating the pumping light both spatially and temporally using a digital micromirror device, a spin image of a vapor cell has been obtained with a distinguishable stripe width of 13.7 μm, which is much smaller than the corresponding diffusion crosstalk free distance of ∼138 μm. The fundamental limit on the spatial resolution as determined by diffusion and the uncertainty principle is analyzed.
We theoretically investigate image storage in hot atomic vapor. A so-called 4f4f4f system is adopted for imaging and an atomic vapor cell is placed over the transform plane. The Fraunhofer diffraction pattern of an object in the object plane can thus be transformed into atomic Raman coherence according to the idea of ``light storage.'' We investigate how the stored diffraction pattern evolves under diffusion and discuss the essence of the stability of its dark spots. Our result indicates, under appropriate conditions, that an image can be reconstructed with high fidelity. The main reason for this procedure is the fact that diffusion of opposite-phase components of the diffraction pattern interferes destructively.