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AIP conference proceedings

Line shape theory in atomic resonant multiphoton ionization

A. Rachman

Published Jan 1, 1990• 0 citations
Publisher
DOI
10.1063/1.39935

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We study experimentally and theoretically the detailed field-amplitude dependence of the multiphoton ionization and excitation probability of highly excited n0{\mathit{n}}_{0}n0​ 3^{3}3S helium atoms in a 9.924-GHz linearly polarized microwave electric field. For ionization, with principal quantum numbers in the range n0{\mathit{n}}_{0}n0​=25--32, we use a quasistatic analysis that employs integration of the time-dependent Schr\"odinger equation using basis states of the static field Hamiltonian. The calculated results are used to interpret the observed ionization threshold structure. For excitation, the results of n0{\mathit{n}}_{0}n0​ 3^{3}3S\ensuremath{\rightarrow}n0{\mathit{n}}_{0}n0​ 3^{3}3L, L>2 excitation experiments are explained quantitatively and precisely using a theory of multiphoton resonances. We present maps of quasienergy levels that allow the study of the dynamics of the field-switching transients. These transient effects are analyzed along the lines of standard atomic collision theory and are shown to determine the shape of the observed resonances.
The author presents a theory for NNN-photon ionization in which two intermediate states can be in resonance with the ground state over a narrow range of photon frequencies. The theory is applied to the three-photon 6F6F6F resonance-state spin-orbit doublet in the four-photon ionization of Cs. The amplitude for the process is the sum of two components, each containing a complex line-shape function. In the limit of zero splitting, the previously studied isolated resonance result, in which the line shape is Lorentzian is recovered. For the splitting in Cs (6F6F6F), the absorption profile is studied as a function of the splitting parameters of the state, the $6S\ensuremath{\rightarrow}6F$ three-photon Rabi rate, and the field-induced shift and width for the $6S\ensuremath{\rightarrow}6F$ transition. This profile depends in a complicated way on the relative magnitudes of the shift and the spacing between the fine-structure levels.