Physical Review Letters
Measurement of Exciton Diffusion Lengths in NdxLa1−xP5O14 by Four-Wave Mixing Techniques
Christopher M. Lawson, Richard C. Powell, Walter K. Zwicker
Abstract
Transient four-wave mixing techniques have been used to measure the decay rate of the excited-state population grating in ${\mathrm{Nd}}_{x}{\mathrm{La}}_{1\ensuremath{-}x}{\mathrm{P}}_{5}{\mathrm{O}}_{14}$ samples as a function of grating spacing. The results show that at room temperature there is diffusive energy migration over distances of the order of 0.36 \ensuremath{\mu}m in the highly concentrated samples.