SINGLE-PHOTON ANNIHILATION AND ELECTRON PAIR PRODUCTION IN A MEDIUM

Zavatta A., Valentina Parigi, Bellini M.

CHANDRASEKARA MUDIYANSELAGE RAKHITHA BANDARA CHANDRASEKARA

L. Lanco

K L Bell

A brief review of single photon free-free transitions, in which a photon is absorbed by an electron in the presence of an atom, is presented.

В. П. Крайнов, Boris Michailovich Smirnov

Michaël Rosticher, F. R. Ladan, J. P. Maneval +6 more

WE REPORT THE DETECTION OF SINGLE ELECTRONS USING A 6 NM-THICK, 100 NM-WIDE, NB0.7TI0.3N SUPERCONDUCTING STRIP DEPOSITED ON A SIOX/SI SUBSTRATE. WHEN BIASED SLIGHTLY BELOW THE CRITICAL CURRENT, A MEANDER-SHAPED DEVICE, NOT ONLY DETECTS SINGLE PHOTONS, BUT ALSO COUNTS THE SINGLE KEV ELECTRONS ISSUED FROM A SCANNING ELECTRON MICROSCOPE (SEM) WITH AN EFFICIENCY APPROACHING UNITY. THE RESPONSE TIME IS SHORT ENOUGH TO DISCRIMINATE THE INCIDENT ELECTRONS FROM THOSE BACKSCATTERED FROM THE UNDERLYING MATERIAL. IT IS THEREFORE POSSIBLE TO MAP THE ELECTRON DETECTIVITY AS WELL AS THE PHOTON DETECTIVITY ON THE SAME DEVICE. A CLEAR CORRELATION BETWEEN THE TWO MEASUREMENTS IS OBSERVED, WITH A SUPERIOR SPATIAL RESOLUTION THOUGH (AROUND 100 NM) FOR THE SEM MAPPING. IT ILLUSTRATES THE POTENTIAL USE OF THIS SINGLE ELECTRON MAPPING BY THE SEM METHOD TO CHARACTERIZE THE DETECTION HOMOGENEITY OF SSPDS