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arXiv:2608.01617

Near-optimal quantum metrology with few-qubit measurements

Liang Mao, Senrui Chen, Hsin-Yuan Huang, John Preskill, Sisi Zhou

quant-phSubmitted Aug 3, 2026• Announced Aug 4, 2026• 0 citations
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Abstract

Quantum metrology, which addresses parameter estimation in quantum systems, has broad applications across science and technology. Conventional metrology protocols for multi-qubit states in the multi-parameter regime typically require highly complex quantum measurements, leading to substantial quantum-resource costs. In this work, we introduce a family of metrology protocols that use only few-qubit measurements, thereby significantly reducing the required resources. For arbitrary pure states, one of our protocols approaches the quantum Cramér-Rao bound up to an overhead in sample complexity that scales linearly with the number of qubits, irrespective of the number of parameters to be estimated. For typical Haar-random states, this overhead can be reduced to a constant. Our results build on recent advances in quantum state certification protocols with few-qubit measurements: we establish a universal connection between certification and metrology in which the precision of the certification protocol determines the metrological overhead. We also illustrate our approach through an example of Hamiltonian estimation from ground states.

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25 pages, 5 figures

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•Jan 1, 2020•8 citations
Quantum metrology, which addresses parameter estimation in quantum systems, has broad applications across science and technology. Conventional metrology protocols for multi-qubit states in the multi-parameter regime typically require highly complex quantum measurements, leading to substantial quantum-resource costs. In this work, we introduce a family of metrology protocols that use only few-qubit measurements, thereby significantly reducing the required resources. For arbitrary pure states, one of our protocols approaches the quantum Cramér-Rao bound up to an overhead in sample complexity that scales linearly with the number of qubits, irrespective of the number of parameters to be estimated. For typical Haar-random states, this overhead can be reduced to a constant. Our results build on recent advances in quantum state certification protocols with few-qubit measurements: we establish a universal connection between certification and metrology in which the precision of the certification protocol determines the metrological overhead. We also illustrate our approach through an example of Hamiltonian estimation from ground states.
The optimal quantum measurements for estimating different unknown parameters in a parameterized quantum state are usually incompatible with each other. Traditional approaches to addressing the measurement incompatibility issue, such as the Holevo Cramér-Rao bound, suffer from multiple difficulties toward practical applicability, as the optimal measurement strategies are usually state-dependent, difficult to implement and also take complex analyses to determine. Here we study randomized measurements as an approach for multiparameter quantum metrology. We show quantum measurements on single copies of quantum states given by 3 -designs perform near-optimally when estimating an arbitrary number of parameters in pure states and more generally, approximately low-rank well-conditioned states, whose metrological information is largely concentrated in a low-dimensional subspace. The near-optimality is also shown in estimating the maximal number of parameters for three types of mixed states that are well conditioned on their supports. Examples of fidelity estimation and Hamiltonian estimation are explicitly provided to demonstrate the power and limitation of randomized measurements in multiparameter quantum metrology.
In quantum metrology, one of the major applications of quantum technologies, the ultimate precision of estimating an unknown parameter is often stated in terms of the Cramér-Rao bound. Yet, the latter is no longer guaranteed to carry an operational meaning in the regime where few measurement samples are obtained, which we illustrate through a simple example. We instead propose to quantify the quality of a metrology protocol by the probability of obtaining an estimate with a given accuracy. This approach, which we refer to as probably approximately correct (PAC) metrology, ensures operational significance in the finite-sample regime. The accuracy guarantees hold for any value of the unknown parameter, unlike the Cramér-Rao bound which assumes it is approximately known. We establish a strong connection to multi-hypothesis testing with quantum states, which allows us to derive an analogue of the Cramér-Rao bound which contains explicit corrections relevant to the finite-sample regime. We further study the asymptotic behavior of the success probability of the estimation procedure for many copies of the state and apply our framework to the example task of phase estimation with an ensemble of spin-1/2 particles. Overall, our operational approach allows the study of quantum metrology in the finite-sample regime and opens up a plethora of new avenues for research at the interface of quantum information theory and quantum metrology.
In quantum metrology, a major application of quantum technologies, the ultimate precision of estimating an unknown parameter is often stated in terms of the Cramér-Rao bound. Yet, the latter fails to completely characterize the distribution of estimates in the nonasymptotic regime. Optimizing metrology protocols with respect to the Cramér-Rao bound can therefore lead to surprisingly poor finite-sample performance. This can be avoided by quantifying the quality of a metrology protocol by the probability of obtaining an estimate with a given accuracy. Using this intrinsically single-shot quantity naturally accommodates the finite-sample regime. We show that the fundamental limits of this figure of merit can be quantified through a multihypothesis testing problem between quantum states. Building on this connection, we derive an analogue of the Cramér-Rao bound that contains explicit corrections relevant to the finite-sample regime. We apply the finite-sample metrology framework to the example task of phase estimation with an ensemble of spin-1/2 particles, giving unambiguous evidence that large quantum Fisher information does not guarantee that a metrology protocol has a good finite-sample performance. Overall, analyzing the probability of success allows the reliable study of quantum metrology in the finite-sample regime and opens up a plethora of new avenues for research at the interface of quantum information theory and quantum metrology.
Estimating multiple unknown parameters simultaneously is essential for practical quantum sensing. However, it faces a fundamental challenge: the optimal strategy for estimating one parameter is often incompatible with that for another, making it impossible to simultaneously achieve the ultimate precision limits for all parameters. Here we develop a general and efficient computational framework that jointly optimizes probe states, control operations, and measurements across different strategy families, including parallel, sequential, and those with indefinite causal order. Our approach provides exact semidefinite-program formulations for several precision bounds, including the Holevo, Nagaoka-Hayashi, and quantum Cramér-Rao bounds. We demonstrate the capabilities of the framework in multiparameter magnetometry and frequency estimation, identifying optimal protocols within each class and revealing a strict hierarchy among the achievable performances of different classes in the multiparameter regime. The framework also directly incorporates resource constraints, such as energy budgets, enabling systematic investigation of experimentally realistic sensing scenarios. Furthermore, we develop a finite-memory optimization method for sequential strategies with restricted ancillary-memory dimension. By decomposing the protocol into initial probe preparation and intermediate control operations, this method provides a practical route to designing resource-constrained sequential sensing schemes. Our work establishes a versatile computational tool for determining fundamental precision limits and designing optimal quantum-sensing protocols in complex multiparameter settings.
Multiparameter quantum metrology is ubiquitous in physics, yet it remains fundamentally challenging. As reflected by the uncertainty principle, distinct unknown parameters generally cannot be estimated simultaneously at their individual ultimate precision limits. The quantum Cramér--Rao bound (QCRB) and the Holevo Cramér--Rao bound (HCRB) represent the ultimate precision bounds in multiparameter quantum metrology. Here we introduce new formulations of these bounds based on quantum state purification. We show that, for any mixed state, their values are directly related to those of its purification, provided that nuisance parameters are introduced on the environmental system. Leveraging this connection, we develop a remarkably simple method for asymptotically attaining either the HCRB or twice the QCRB for arbitrary mixed states, using random purification channels and individual measurements.
This is a tutorial aimed at illustrating some recent developments in quantum parameter estimation beyond the Cramèr–Rao bound, as well as their applications in quantum metrology. Our starting point is the observation that there are situations in classical and quantum metrology where the unknown parameter of interest, besides determining the state of the probe, is also influencing the operation of the measuring devices, e.g. the range of possible outcomes. In those cases, nonregular statistical models may appear, for which the Cramèr–Rao theorem does not hold. In turn, the achievable precision may exceed the Cramèr–Rao bound, opening new avenues for enhanced metrology. We focus on quantum estimation of Hamiltonian parameters and show that an achievable bound to precision (beyond the Cramèr–Rao) may be obtained in a closed form for the class of so-called controlled energy measurements. Examples of applications of the new bound to various estimation problems in quantum metrology are worked out in some details.